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Automating On-Wafer Measurements with the new Agilent IC-CAP WaferPro 
Originally broadcast Jan 27, 2011

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Ubiquitous Test with LXI Instrumentation 
Original broadcast Nov 2, 2011

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Innovations in EDA Webcast: Measurement-based FET modeling using Artificial Neural Networks (ANNs) 
Original broadcast Feb 2, 2012

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Setting Up IC-CAP WaferPro For On-Wafer Measurements 
Original broadcast June 22, 2011

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The Fundamentals of IV Measurement 
Live broadcast Apr 10, 2012; 10am Pacific / 1pm Eastern

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Parametric Test Basic Training Part 2 
Originally broadcast Jan 19, 2011

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Today’s Power Supplies: Meeting Basic and Sophisticated Application Requirements 
Originally broadcast June 29, 2011

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Modern Remote and Wireless Test Setup and Considerations 
This seminar describes remote/wireless test setups and configurations with LXI compliant instruments with low cost, off the shelf network products. We review local and long distance wireless test, security hurdles and using smart devices and clouds.

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New Benchtop SMUs with Color GUI Meet Difficult Component Test Challenges Webcast 
Originally broadcast June 16, 2011

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