數位與類比設計
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依應用
- 高速數位解決方案 (12)
- DisplayPort 設計與測試 (1)
- HDMI 設計與測試 (1)
- MHL (1)
- PCIe 2.0/3.0、PCI Express® 的設計與測試資訊資源中心 (1)
- 序列 ATA (SATA) (5)
- 串列連接 SCSI (SAS) (1)
- USB (2.0/3.0/無線) (2)
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依產品分類
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所有產品分類
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示波器、分析儀、儀錶
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網路分析儀
- PNA 系列微波網路分析儀, 300 kHz ~ 1.05 THz (3)
- ENA 系列 RF 網路分析儀 (15)
- 網路分析儀配件 (2)
- Network Analyzer Software (17)
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網路分析儀
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示波器、分析儀、儀錶
1-21 / 21
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改善示波器高頻主動探棒的可用性與效能。應用手冊1419-02
本應用手冊將探討三種高頻寬的主動式測試棒的構造。
應用手冊 2002-12-10 |
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6 Hints for Better SATA and SAS Measurements
These 6 Hints for better SATA and SAS measurements cover Tx, Rx, Impedance and Return Loss, and Host/Device Digital testing challenges.
應用手冊 2012-02-02 |
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Agilent Method of Implementation (MOI) for DisplayPort Cable-Connector Assembly Compliance Test
Agilent Method of Implementation (MOI) for DisplayPort Cable-Connector Assembly Compliance Test Using Agilent E5071C ENA Network Analyzer Option TDR
應用手冊 2013-02-18 |
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Agilent Method of Implementation (MOI) for MHL Cables Compliance Tests
Agilent Method of Implementation (MOI) for MHL Cable Compliance Tests Using Agilent E5071C ENA Network Analyzer Option TDR
應用手冊 2013-02-14 |
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Agilent Method of Implementation (MOI) for MIPI D-PHY Conformance Tests
Agilent Method of Implementation (MOI) for MIPI D-PHY Conformance Tests Using Agilent E5071C ENA Network Analyzer Option TDR
應用手冊 2011-12-01 |
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Agilent Method of Implementation (MOI) for MIPI M-PHY Conformance Tests
Agilent Method of Implementation (MOI) for MIPI M-PHY Conformance Tests Using Agilent E5071C ENA Network Analyzer Option TDR
應用手冊 2011-12-01 |
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Agilent Method of Implementation (MOI) for PCI Express 3.0 PCB Differential Trace Impedance Test
Agilent Method of Implementation (MOI) for PCI Express 3.0 PCB Differential Trace Impedance Test Using Agilent E5071C ENA Network Analyzer Option TDR
應用手冊 2012-10-16 |
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Agilent Method of Implementation (MOI) for SATA RXTX Compliance Test
Agilent Method of Implementation (MOI) for SATA RXTX Compliance Test Using Agilent E5071C ENA Network Analyzer Option TDR
應用手冊 2011-01-12 |
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Agilent Method of Implementation (MOI) for SATA SI Compliance Test
Agilent Method of Implementation (MOI) for SATA SI Compliance Test Using Agilent E5071C ENA Network Analyzer Option TDR
應用手冊 2011-01-12 |
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Agilent Method of Implementation (MOI) for USB3.0 Cable-Connector Assembly Compliance Test
Agilent Method of Implementation (MOI) for USB3.0 Cable-Connector Assembly Compliance Test Using Agilent E5071C ENA Network Analyzer Option TDR
應用手冊 2012-12-17 |
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Characterization of Balanced Digital Components and Communication Paths
應用手冊 2001-11-19 |
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Designing High Speed Backplanes Utilizing Physical Layer Test System
This Application Note focuses on the problems introduced into the backplane assembly design by the many linear passive components that create reflections due to impedance discontinuities.
應用手冊 2006-01-18 |
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Effective Reflection Characterization for Active Devices Using ENA Option TDR Application Note
This application note describes Hot TDR measurement, which is an effective characterization method for the reflection of transmitter and receiver.
應用手冊 2012-01-12 |
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Limitations and Accuracies of Time and Frequency Domain Analysis of Physical Layer Devices
應用手冊 2005-11-01 |
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Measurement Uncertainty of VNA based TDR/TDT Measurement Application Note
This application note explains the theory of measurement uncertainty in TDR/TDT measurement with the ENA Option TDR.
應用手冊 2011-07-08 |
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Method of Implementation (MOI) for HDMI 1.4b Cable Assembly Test
Method of Implementation (MOI) for HDMI 1.4b Cable Assembly Test Using Agilent E5071C ENA Network Analyzer Option TDR.
應用手冊 2013-04-24 |
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Network Analysis - De-embedding and Embedding S-Parameter Networks (1364-1)
At RF and microwave frequencies, it becomes difficult to directly measure devices with nonstandard connectors (for example, devices using surface-mount packaging).
應用手冊 2004-06-01 |
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S-Parameter Techniques for Faster, More Accurate Network Design (AN 95-1)
This Application Note is for information only. Agilent no longer sells or supports these products.
應用手冊 1967-02-01 |
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Signal Integrity Analysis Series Part 1: Single-Port TDR, TDR/TDT, & 2-Port TDR
This Application Note focuses on part 1: those which use a single-port TDR, those which use TDR/TDT, and those which use 2-port TDR.
應用手冊 2007-01-01 |
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Signal Integrity Analysis Series Part 2: 4-Port TDR/VNA/PLTS
This Application Note focuses on part 2: those which use a 4-port TDR/VNA/PLTS.
應用手冊 2007-02-21 |
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Signal Integrity Analysis Series Part 3: The ABCs of De-Embedding
This Application Note focuses on Part 3: The ABCs of De-Embedding explaining different de-embedding techniques & shows how to minimize fixture effects for best results.
應用手冊 2007-07-01 |
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