Digital Design & Interconnect Standards
Achieve your best design with Agilent. Investigate specific solutions for high speed standards plus solutions for your high-speed digital design cycle (design, simulation, analysis, debug compliance and signal integrity) challenges.
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Oscilloscopes, Analyzers, Meters
- Bit Error Ratio Test (BERT) Solutions
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Oscilloscopes, Analyzers, Meters
1-25 of 27
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Accurate Calibration of Receiver Stress Test Signals for PCI Express® Rev. 3.0
This paper describes the calibration of the receiver-stress signal according to the base specification of PCIe3. The calibration of the RX test signal is different from PCIe 2.0.
Application Note 2011-06-22 |
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Advanced Techniques for PCIe 3.0 Receiver Testing-Paper
Advanced Techniques for PCIe 3.0 Receiver Testing-Paper
Application Note 2011-09-01 |
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Automated PCI Express Receiver Compliance Test and Characterization with N5990A
This product note shows how to use the test automation software platform to verify and debug your PCI Express bus designs. As an example, a multi-lane add-in card is used.
Application Note 2006-08-29 |
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Automated USB 2.0 Receiver Compliance Test and Characterization with the Agilent N5990A
Automated USB 2.0 Receiver Compliance Test and Characterization with the Agilent N5990A Software Platform: 8 pages
Application Note 2007-01-31 |
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Benefits of using PCI Express 2.0.
An overview of the main features and benefits of using PCI Express 2.0
Application Note 2008-10-17 |
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Calibrated Jitter, Jitter Tolerance Test and Jitter Laboratory with the Agilent J-BERT N4903A
This application note describes the N4903A BERT characterization solution for emerging serial gigabit devices: it helps engineers make quick and accurate jitter tolerance tests, which have been complicated and hard to do in the past.
Application Note 2006-07-18 |
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Eye Characterization on Idle and Framed Data Traffic: the Bit Recovery Mode
Traditionally, bit error rate testing compares the bits from a Device Under Test (DUT) against a reference data set, called the expected data. The user of Bit Error Ratio Tester (BERT) has to provide this expected data and load it into the tester.
Application Note 2005-09-21 |
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Fast Total Jitter Test Solution
This application note compares different total jitter measurement and extrapolation techniques to the Fast Total Jitter Measurement
Application Note 2005-08-29 |
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Finding Sources of Jitter with Real-Time Jitter Analysis (AN 1448-2)
This application note describes how to use a real-time oscilloscope with jitter analysis, along with the stimulus-response techniques, to meet the critical time-correlation requirement to relate jitter trend measurement results to measured signals.
Application Note 2003-06-30 |
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Flat Panel Display Link Test
This Product Note shows how to verify the Bit Error Rate (BER) of 1-serial to 7-parallel Rx chip with the Agilent 81250 Parallel Bit Error Ratio Tester (ParBERT).
Application Note 2004-07-29 |
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Forward Clocking - Receiver (RX) Jitter Tolerance Test with J-BERT N4903B High-P
This document describes the requirements for forward clocking topology RX Jitter tolerance testing.
Application Note 2009-03-24 |
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HDMI Sink and Source Compliance Test and Characterization
In this product note examples are given for advanced, automated HDMI compliance tests and characterization based on a high bandwidth oscilloscope, a TMDS Signal Generator and the Test Automation Software Platform.
Application Note 2006-10-27 |
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How to characterize the Physical Layer of the Mobile Industry Processor Interface (MIPI D-PHY)
How to characterize the Physical Layer of the Mobile Industry Processor Interface (MIPI D-PHY)
Application Note 2007-07-30 |
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How to Pass Receiver Test According to PCI Express® 3.0 CEM Specification
This paper provides insight into the calibration method and tests, as well as the tools available. The biggest change between PCIe 2.x and rev. 3.0 is that RX test on cards will now be normative.
Application Note 2011-11-30 |
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How to use the Agilent 81200 together with Agilent VEE
This attached Product Note shows how to use the Agilent 81200 Data Generator/Analyzer together with Agilent VEE for Signal Integrity Analysis.
Application Note 2002-01-28 |
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Jitter Analysis Techniques for High Data Rates (AN 1432)
This new application note describes the basic jitter measurements and the specific measurement techniques used in SONet/SDH/OTN and Gigabit Ethernet applications.
Application Note 2003-02-03 |
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Jitter Fundamentals: Jitter Tolerance Testing with Agilent ParBERT 81250
This applicaiton note describes gain fast and efficient insight into the operation and performance of CDR, clock system and jitter tolerance.
Application Note 2003-12-02 |
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Measuring Jitter in Digital Systems (AN 1448-1)
Measuring jitter and how to calculate total jitter.
Application Note 2008-01-30 |
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Measuring Jitter with the Agilent E4874A Characterization Software Components
The Product Note shows how to measuring jitter with the Agilent E4874A Characterization Software Components on the Agilent 81200 Data Generator/Analyzer Platform. See also R & D Central at: http://www.agilent.com/find/randd Select "Bit Error Ratio Testing (BERT)" on that page. Then...
Application Note 2000-06-01 |
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Method of Implementation (MOI) for DisplayPort
Agilent Method of Implementation (MOI) for DisplayPort Sink Compliance Tests
Application Note 2007-11-03 |
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Method of Implementation (MOI) for DisplayPort Sink Compliance Test
Method of Implementation (MOI) for DisplayPort Sink Compliance Test
Application Note 2008-08-18 |
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PCI Express Receiver Design Validation Test with 81134A / 81250A
Describes functional validation and compliance and stress tests for PCI Express receiver design
Application Note 2005-03-18 |
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PCI Express® Revision 2 - Receiver Testing With J-BERT N4903A and 81150A Pulse
Application Note 2008-12-03 |
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PCIe Revision 2 Receiver Jitter Tolerance Testing with J-BERT N4903B
This document focuses on physical layer testing of the transmitter (TX) and receiver (RX) ports of PCI EXPRESS® (PCIe) devices.
Application Note 2006-01-30 |
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Upgrade to PCI Express 2.0© Receiver Test
The 15431A is a filter set for the 81150A. It generates the random jitter profile for testing PCI Express 2.0 receivers, to be used in conjunction with the N4903A. This fact sheet explains the upgrade.
Application Note 2008-10-24 |
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