Digital Design & Interconnect Standards

Achieve your best design with Agilent. Investigate specific solutions for high speed standards plus solutions for your high-speed digital design cycle (design, simulation, analysis, debug compliance and signal integrity) challenges.

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  - Application Note (164)

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1-25 of 164

10 Hints for Getting the Most from your Frequency Counter Maximize the results you get from your frequency counter through 10 hints from better from understanding the architecture to making faster measurements. Application Note 2008-04-18	PDF 263 KB Sprachen English \| 2008-04-18 \| PDF 263 KB 中文（简体） \| 2008-07-01 \| PDF 575 KB 日本語 \| 2008-05-26 \| PDF 890 KB 中文（繁體） \| 2008-04-18 \| PDF 263 KB 한국어 \| 2008-04-18 \| PDF 263 KB
10 Reasons to Upgrade to a 16800 or 16900 Series Logic Analyzer 10 Reasons to Upgrade to a 16800 or 16900 Series Logic Analyzer Application Note 2007-12-03	PDF 999 KB Sprachen English \| 2007-12-03 \| PDF 999 KB 中文（简体） \| 2008-10-01 \| PDF 1.07 MB
6 Hints for Better SATA and SAS Measurements These 6 Hints for better SATA and SAS measurements cover Tx, Rx, Impedance and Return Loss, and Host/Device Digital testing challenges. Application Note 2012-02-02	PDF 1.59 MB
8 Hints for Debugging and Validating High-speed Buses 8 Hints for Debugging High-speed Buses Application Note 2002-03-05	PDF 2.24 MB
8 Hints for Debugging Siemens MCU-based Designs A new type of instrument, the mixed signal oscilloscope (MSO), closes the gap in MCU debugging tools. The Agilent 54645D from Hewlett-Packard combines two analog scope channels with 16 digital logic channels, so you can monitor analog and digital lines at the same time. This MSO offers more... Application Note 1998-11-01	PDF 736 KB
A Simple, Powerful Method to Characterize Differential Interconnects The Automatic Fixture Removal (AFR) process is a new technique to extract accurate, high bandwidth models of interconnects that is both simple and accurate. Application Note 2011-06-17	PDF 3.48 MB
A Time-Saving Method for Analyzing Signal Integrity in DDR Memory Buses This application note covers new tools and measurement techniques for characterizing and validating signal integrity of DDR (double data rate synchronous dynamic random access memory) signals. Application Note 2008-09-10	PDF 792 KB Sprachen English \| 2008-09-10 \| PDF 792 KB 日本語 \| 2007-07-24 \| PDF 4.08 MB
Accurate Calibration of Receiver Stress Test Signals for PCI Express® Rev. 3.0 This paper describes the calibration of the receiver-stress signal according to the base specification of PCIe3. The calibration of the RX test signal is different from PCIe 2.0. Application Note 2011-06-22	PDF 4.82 MB Sprachen English \| 2011-06-22 \| PDF 4.82 MB 日本語 \| 2011-07-27 \| PDF 3.05 MB
Advanced Jitter Generation and Analysis Product Note This product note shows how the Agilent pulse generators can be used with the DCA-J Oscilloscope. Application Note 2004-10-04	PDF 549 KB
Advanced Memory Buffer (AMB), Characterization of Timing and Voltage Specification Advanced Memory Buffer (AMB), Characterization of Timing and Voltage Specification Application Note 2005-09-22	PDF 812 KB
Advanced Techniques for PCIe 3.0 Receiver Testing-Paper Advanced Techniques for PCIe 3.0 Receiver Testing-Paper Application Note 2011-09-01	PDF 2.20 MB
Advanced VNA-Based Test Systems for Analysis of High-Speed Digital Interconnect - Application Note Discusses interconnect testing and present solutions based on the latest generation of test software (PLTS2011) for Agilent's line of performance network analyzers (PNAs) focused on Software. Application Note 2012-01-19	PDF 2.22 MB Sprachen English \| 2012-01-19 \| PDF 2.22 MB 中文（简体） \| 2012-01-19 \| PDF 2.22 MB 한국어 \| 2012-01-19 \| PDF 2.22 MB
Agilent HDMI 1.4 Whole Solution Media Recommended in CTS 1.4 Application Note 2009-11-20	PDF 1.89 MB
Agilent Method of Implementation (MOI) for DisplayPort Cable-Connector Assembly Compliance Test Agilent Method of Implementation (MOI) for DisplayPort Cable-Connector Assembly Compliance Test Using Agilent E5071C ENA Network Analyzer Option TDR Application Note 2013-02-18	PDF 1.29 MB
Agilent Method of Implementation (MOI) for MHL Cables Compliance Tests Agilent Method of Implementation (MOI) for MHL Cable Compliance Tests Using Agilent E5071C ENA Network Analyzer Option TDR Application Note 2013-02-14	PDF 1.76 MB Sprachen English \| 2013-02-14 \| PDF 1.76 MB 日本語 \| 2013-02-14 \| PDF 1.76 MB
Agilent Method of Implementation (MOI) for MIPI D-PHY Conformance Tests Agilent Method of Implementation (MOI) for MIPI D-PHY Conformance Tests Using Agilent E5071C ENA Network Analyzer Option TDR Application Note 2011-12-01	PDF 920 KB
Agilent Method of Implementation (MOI) for MIPI M-PHY Conformance Tests Agilent Method of Implementation (MOI) for MIPI M-PHY Conformance Tests Using Agilent E5071C ENA Network Analyzer Option TDR Application Note 2011-12-01	PDF 918 KB
Agilent Method of Implementation (MOI) for PCI Express 3.0 PCB Differential Trace Impedance Test Agilent Method of Implementation (MOI) for PCI Express 3.0 PCB Differential Trace Impedance Test Using Agilent E5071C ENA Network Analyzer Option TDR Application Note 2012-10-16	PDF 1.62 MB
Agilent Method of Implementation (MOI) for SATA RXTX Compliance Test Agilent Method of Implementation (MOI) for SATA RXTX Compliance Test Using Agilent E5071C ENA Network Analyzer Option TDR Application Note 2011-01-12	PDF 1.19 MB
Agilent Method of Implementation (MOI) for SATA SI Compliance Test Agilent Method of Implementation (MOI) for SATA SI Compliance Test Using Agilent E5071C ENA Network Analyzer Option TDR Application Note 2011-01-12	PDF 1.41 MB
Agilent Method of Implementation (MOI) for USB3.0 Cable-Connector Assembly Compliance Test Agilent Method of Implementation (MOI) for USB3.0 Cable-Connector Assembly Compliance Test Using Agilent E5071C ENA Network Analyzer Option TDR Application Note 2012-12-17	PDF 1.82 MB
Agilent MOI for SATA SI (Cable) Tests Using Agilent E5071C with Option TDR - Application Note 2011-01-12	PDF 1.41 MB
Agilent MOI for SATA TXRX Tests Using Agilent 86100C TDR Application Note 2009-09-10	PDF 479 KB
Agilent MOI for SATA TXRX Tests Using Agilent E5071C ENA with Option TDR - Application Note 2011-01-12	PDF 1.19 MB
Agilent N4900 Serial BERT Series Jitter Injection and Analysis Capabilities The fundamentals of Jitter and it's capabilities with the N4900. Application Note 2003-11-01	PDF 3.99 MB Sprachen English \| 2003-11-01 \| PDF 3.99 MB 中文（简体） \| 2003-07-17 \| PDF 1.77 MB

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