Digital Design & Interconnect Standards
Achieve your best design with Agilent. Investigate specific solutions for high speed standards plus solutions for your high-speed digital design cycle (design, simulation, analysis, debug compliance and signal integrity) challenges.
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Oscilloscopes, Analyzers, Meters
1-18 of 18
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A Time-Saving Method for Analyzing Signal Integrity in DDR Memory Buses
This application note covers new tools and measurement techniques for characterizing and validating signal integrity of DDR (double data rate
synchronous dynamic random access memory) signals.
Application Note 2008-09-10 |
PDF
792 KB
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An Overview of the Electrical Validation of 10BASE-T, 100BASE-TX, and 1000BASE-T
The technology used in these ports, commonly known as “LAN” or “NIC” ports, is usually one of the 10BASE-T, 100BASE-TX, and 1000BASE-T standards or a combination of them.
Application Note 2011-01-11 |
PDF
1.21 MB
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Boosting PLL Design Efficiency From free-running VCO characterizations to closed-loop PLL evaluation
This application note describes introduces practical solutions for VCO/PLL performance evaluation and gives actual examples of parameter measurements using the E5052B.
Application Note 2008-11-21 |
PDF
2.91 MB
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Characterizing Clock Jitter through Phase Noise Measurements Speeds up Design Verification Process
This white paper discusses a new measurement method for obtaining highly accurate low random jitter (RJ) measurements and performing real-time analysis of RJ and periodic jitter (PJ) of components.
Application Note 2008-11-20 |
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Debugging USB 2.0: It's Not Just A Digital World (AN 1382-3)
Debugging USB 2.0 Systems
Application Note 2006-10-05 |
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Evaluating Oscilloscope Sample Rates vs. Sampling Fidelity
Evaluating Oscilloscope Sample Rates vs. Sampling Fidelity: How to Make the Most Accurate Digital Measurements When you select an oscilloscope for accurate, high-speed digital measurements, sampling fidelity can often be more important than maximum sample rate.
Application Note 2012-11-11 |
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Finding Sources of Jitter with Real-Time Jitter Analysis (AN 1448-2)
This application note describes how to use a real-time oscilloscope with jitter analysis, along with the stimulus-response techniques, to meet the critical time-correlation requirement to relate jitter trend measurement results to measured signals.
Application Note 2003-06-30 |
PDF
1.70 MB
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Improving Usability and Performance in High-Bandwidth Active Oscilloscope Probes (AN 1419-02)
Understand how to get minimal probe loading and highest-possible-performance representation of your signal.
Application Note 2002-11-01 |
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Integrated Debugging-A New Approach to Troubleshooting Your Designs with Real-Time Oscilloscopes
Traditional debugging can be time consuming and inefficient. With Agilent Infiniium oscilloscopes,
“integrated debugging” is a reality, and it leads you directly to the root cause of problems.
Application Note 2008-01-30 |
PDF
1.17 MB
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Low Voltage Differential Signaling, (AN 1382-6)
Using LVDS for High Speed Data Transmission
Application Note 2001-12-17 |
PDF
2.53 MB
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Measuring Close-In AM in the Presence of FM (PN 8590-5)
This Product Note explains how to use the FFT function in 8590 C/E/L-series Spectrum Analyzers with Fast Fourier Transform (FFT). FFT simplifies AM analysis by providing a smart user interface.
AM measurements of RF or microwave signals are quick, continuous, and repeatable even when FM is...
Application Note 2000-07-01 |
PDF
137 KB
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Measuring Third-Order Intermodulation, N dB Bandwidth, and Percent AM with Built-In Functions (PN...
This Product Note explains how to use three of the advanced functions found in all 8590 C/E/L-series Spectrum Analyzers. The three functions are:
Contents
Third-Order Intermodulation
N dB Bandwidth
Percent AM
Application Note 2000-07-01 |
PDF
86 KB
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Preselector Tuning for Amplitude Accuracy in Microwave Spectrum Analysis
This 8 page application note introduces the technique for broadband modulated signals employed in the new MXA signal analyzer.
Application Note 2009-08-14 |
PDF
387 KB
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Solutions for MB-OFDM Ultra-Wideband (UWB) Application Note
Application note describes hardware and software for ultra wideband (UWB) testing.
Application Note 2008-08-10 |
PDF
2.63 MB
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Spectral Analysis Using a Deep Memory Oscilloscope FFT (AN 1383-1))
Many of today's digital oscilloscopes include a Fast Fourier Transform (FFT) for frequency-domain analysis. This feature is especially valuable for oscilloscope users who have limited or no access to a spectrum analyzer yet occasionally need frequency-domain analysis capability. An integrated...
Application Note 2001-11-15 |
PDF
1.54 MB
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Spectrum Analysis Application Notes
Download a copy of AN150, both high and low resolution PDF's are available.
Application Note 2004-04-27 |
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USB 2.0 Compliance Testing with Infiniium Oscilloscopes - Application Note
This Application Note discusses the Agilent solution for the USB 2.0 test suite. The Agilent solution is the only one-box solution that uses the official USB-IF scripts for precompliance ans compliance testing.
Application Note 2013-05-10 |
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2.02 MB
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Using Clock Jitter Analysis to Reduce BER in Serial Data Applications
This Application Note emphasizes on the emerging techniques for reference clock jitter analysis from the perspective of oscillator physics, phase noise theory, and serial data technology.
Application Note 2006-12-01 |
PDF
1.15 MB
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