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Agilent　IC-CAP デバイス・モデリング・ソフトウェア 
半導体デバイス・モデリング用高精度パラメータ抽出

技術概要 2013-03-06

PDF PDF 1.72 MB
言語 
Designing to Digital Wireless Specifications using Circuit Envelope Simulation 
This Paper by How-Siang Yap discusses the Circuit Envelope technology developed specifically to simulate modern wireless circuits with complex digitally modulated RF signals such as CDMA and TDMA.

技術概要 1998-06-01

PDF PDF 245 KB
Overview on 1.6-mW LC-tuned VCO Design for 2.4GHz in 0.18-um RF CMOS Technology 
The Paper details the design of the VCO using the Agilent ADS harmonic balance and Momentum simulators.

技術概要 2002-03-01

PDF PDF 687 KB
Overview on CMOS RFIC Upconversion Mixer Design 
This Paper presents a mixer design using Agilent’s ADS 2001 Mixer DesignGuide. The Mixer DesignGuide was used to create simulation setups, data displays and impedance matching.

技術概要 2001-11-01

PDF PDF 367 KB
Overview on Low-Power Mixer Design Example using ADS 
This Technical Overview describes a method for designing a low-power, single-transistor active mixer using ADS. It includes details on the design steps, simulation setups and data displays.

技術概要 1995-01-01

PDF PDF 521 KB
Overview on Mixer Simulation with Agilent's ADS 
This Technical Note covers some of the details required to simulate mixers with Agilent's Advanced Design System.

技術概要 1998-01-01

PDF PDF 250 KB
Overview on Modeling of a TSOP44 Package 
This Paper presents a step-by-step tutorial based on the IC-CAP model detailing how to model a TSOP44 package using the test fixture.

技術概要 2001-09-01

PDF PDF 1.06 MB
Overview on Noise in Ring Topology Mixers 
This Paper explores the formal definition of noise figure and shows the ADS noise figure definition, and also shows that the noise figure for a mixer does not have to exceed its conversion loss.

技術概要 2003-06-17

PDF PDF 234 KB
Overview on Phase Noise and Jitter 
This Paper by Rick Poore (Agilent Technologies) focuses on the relationship between phase noise and jitter in free-running oscillators.

技術概要 2001-05-17

PDF PDF 252 KB
Overview on RF Circuits Integration using CMOS SOI 0.25 µm Technology 
This Paper gives a brief overview of the Silicon On Insulator (SOI) technology and also introduces two RF designs performed successfully with 0.25μm SOI technology.

技術概要 2002-03-01

PDF PDF 515 KB
Proposed System Solution for 1/f Noise Parameter Extraction 
This paper describes a measurement setup for measuring the 1/f noise of Bipolar and MOS devices.

技術概要 2000-12-01

PDF PDF 628 KB