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AOI - A Strategy for Closing the Loop 
This paper describes a set of defect prevention solutions centered on the availability of high-quality inspection and measurements data from an AOI system and a few carefully engineered software applications

Application Note 2006-04-16

PDF PDF 291 KB
Automated Measurement with IC-CAP 
This application note describes a seamless solution for automated measurement and parameter extraction with Agilent IC-CAP

Application Note 2011-01-10

PDF PDF 1.42 MB
Languages 
Automating Agilent 14565B Software Battery Drain Measurements with LabVIEW 
This document describes the process of making battery drain measurements with the Agilent 14565B and National Instruments Labview

Application Note 2007-10-11

PDF PDF 188 KB
Automotive ECU Transient Testing Using Captured Power System Waveforms 

Application Note 2008-01-10

PDF PDF 939 KB
Languages 
Automotive Electronic Functional Test Using Agilent System Components 
This application note describes how best to use Agilent System Components to create a re-usable system tuned for low frequency automotive electronic functional test.

Application Note 2005-08-30

PDF PDF 505 KB
Languages 
AXI and Lead-Free Process Characterization 
How to use Automated X-ray Inspection as a tool to characterize new lead-free soldering processes.

Application Note 2005-06-21

 
Battery Drain Analysis Improves Mobile-Device Operating Time 
Using specialized tools and analysis techniques can help you create mobile-device designs that extend battery life and improve your productivity.

Application Note 2007-02-01

PDF PDF 1.07 MB
Languages 
Battery Testing (AN 372-2) 
This Application Note shows how an electronic load can be used to discharge batteries of various chemistries to determine actual capacity, capacity retention and impedance.

Application Note 2002-02-22

PDF PDF 483 KB
Languages 
Bearing Runout Measurements (AN 243-7) 
This Application Note introduces the challenge of making runout measurements in disk drives, which is a critical step in increasing storage capacity. It explains the test setup required and shows measurements of repeatable and non-repeatable runout, synchronous and asynchronous runout, and...

Application Note 2000-05-01

PDF PDF 197 KB
Languages 
Bench-Top Test and Debug of Power Transient Issues for Automotive and Aerospace/Defense Applications 

Application Note 2009-06-05

PDF PDF 1000 KB
Languages 
Boundary Scan Ground Bounce Suppression 
Boundary-Scan circuitry, while in the process of testing interconnections, can set up and excite current surges on a board. This in turn can cause "ground bounce".

Application Note 1998-04-24

PDF PDF 14 KB
Boundary Scan Helps EMS Companies Cut Test Costs and Increase Revenues 
Electronics Manufacturing Services (EMS) providers can utilize boundary-scan to reduce test cost expenses and also generate additional revenue opportunities.

Application Note 2003-03-01

PDF PDF 242 KB
Boundary-Scan Technology, Justification, and Test Implementation for Designers 
This paper provides practical insight for designers on the merits, design, and test implementation of Boundary-Scan Technology.

Application Note 1998-05-27

PDF PDF 29 KB
Breakthrough Innovations: Agilent Automated Silicon Nails 
Automated Silicon Nails takes the popular IEEE 1149.1 Boundary-Scan standard even further by using Boundary-Scan chains to automatically test non-Boundary-Scan devices.

Application Note 2001-08-15

PDF PDF 460 KB
Characterizing the I-V Curve of Solar Cells and Modules 
This measurement brief explores the various test and measurement tools you can use for I-V curve characterization and provides tips to help you choose the instrument or instruments that best fit your solar cell or module measurement needs.

Application Note 2009-12-02

PDF PDF 250 KB
Languages 
Cheetah PNA RCS and Antenna Measurement System 
Introducing a radar measurement system based on Agilent's PNA network analyzer. Reprinted with permission of SPC Corp.

Application Note 2004-03-03

PDF PDF 582 KB
Comparing AOI and AXI 
Choosing the right technology requires looking at board mix, capital budget and other business considerations. But most of all, you need to understand the typical characteristics of each technology.

Application Note 2001-07-25

PDF PDF 42 KB
Complete Analysis of Erbium-Doped Fiber Amplifiers 
This Technical Paper discusses methods and instruments for measuring EDFAs with respect to gain and noise figure, both in static and dynamic form, polarization dependence, polarization mode dispersion, WDM characteristics and more. The influence of the spectral width of the laser source on the...

Application Note 1996-03-01

PDF PDF 142 KB
Complete S-Parameter and Distortion Measurement for Wide Band Video Amplifier (AN 357-2) 
This Application Note is for information only. Agilent no longer sells or supports these products.

Application Note 1988-02-01

PDF PDF 367 KB
Configuring Signal and Load Switching Using Agilent TestExec SL 
This application note describes how users of the Agilent TestExec SL software can easily configure and set up switching for the increasing number of channels on units under test with the Switch Manager feature in the software.

Application Note 2009-08-13

PDF PDF 286 KB
Connecting a UPS to a 3070 Controller 
This paper describes how to connect a UPS to the 3070 testhead controller. It uses the Advanced Power Conversion Smart-UPS with PowerChute Plus software.

Application Note 2003-01-07

PDF PDF 87 KB
Considerations for Surface Map Setup 
The concept of delta-Zs is perhaps the most difficult thing to understand about the surface map process.

Application Note 2006-08-08

 
Creating Hardware Handler in C/C++ for Agilent TestExec SL 
A hardware handler enhances the Agilent TestExec SL's ability to control devices by communicating directly with the instrument's driver. This application note describes how to create hardware handlers for the TestExec SL.

Application Note 2009-09-10

PDF PDF 181 KB
Creating Measurement-Based Amplifier Behavioral Models 
This Application Note describes a behavioral model used in circuit and system simulations to verify performance of the amplifier within a circuit or system.

Application Note 2003-10-01

PDF PDF 469 KB
Languages 
Current Drain Analysis Enhances WLAN Network Card Design and Test (AN 1468) 
This application note explains how to simplify the complex task of accurately measuring and evaluating the current drain of a WLAN network card for its various operating modes.

Application Note 2006-12-14

PDF PDF 394 KB
Languages 

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