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    - Digital Modulation, Time & Error Measurements (5)

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Complete Analysis of Erbium-Doped Fiber Amplifiers This Technical Paper discusses methods and instruments for measuring EDFAs with respect to gain and noise figure, both in static and dynamic form, polarization dependence, polarization mode dispersion, WDM characteristics and more. The influence of the spectral width of the laser source on the... Application Note 1996-03-01	PDF 142 KB
Evaluating Microstrip with Time Domain Reflectometry (AN 1304-1) This application note discusses microstrip transmission line techniques that were evaluated using TDR measurements. Application Note 2000-11-01	PDF 349 KB Languages English \| 2000-11-01 \| PDF 349 KB 日本語 \| 2001-01-31 \| PDF 496 KB
High Precision Time Domain Reflectometry (AN 1304-7) Techniques for achieving the highest possible accuracy and resolution in signal integrity impedance measurements Application Note 2003-10-27	PDF 3.72 MB Languages English \| 2003-10-27 \| PDF 3.72 MB 日本語 \| 2004-04-20 \| PDF 4.07 MB
High-Precision TDR with the Agilent 86100 DCA & Picosecond Pulse Labs 4020 Source Enhancement Module Learn how to build a high-precision time-domain reflectometry/time-domain transmission measurement system. Application Note 2003-09-12	PDF 288 KB
Measuring Characteristic Impedance of Short Rambus Motherboard Traces (AN 1304-4) This application note tells you how to perform characteristic impedance measurements on Rambus motherboards and SO-RIMM's using TDR with normalization and verification. Application Note 2000-11-01	PDF 426 KB Languages English \| 2000-11-01 \| PDF 426 KB 日本語 \| 2002-09-30 \| PDF 707 KB
Optical Spectrum Analyzer Amplifier Test Application (PN 86140-5) The product note explains how the Agilent OSA amplifier test application provides a cost-effective solution for reducing test time. Application Note 2002-03-15	PDF 642 KB
Time Domain Reflectometry Theory (AN 1304-2) This application note discusses the fundamentals of TDR and then relates these fundamentals to the parameters that can be measured in actual test situations. Application Note 2002-08-29	PDF 190 KB Languages English \| 2002-08-29 \| PDF 190 KB 日本語 \| 2000-03-01 \| PDF 1.42 MB

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