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Complete Analysis of Erbium-Doped Fiber Amplifiers
This Technical Paper discusses methods and instruments for measuring EDFAs with respect to gain and noise figure, both in static and dynamic form, polarization dependence, polarization mode dispersion, WDM characteristics and more. The influence of the spectral width of the laser source on the...
Application Note 1996-03-01 |
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Evaluating Microstrip with Time Domain Reflectometry (AN 1304-1)
This application note discusses microstrip transmission line techniques that were evaluated using TDR measurements.
Application Note 2000-11-01 |
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High Precision Time Domain Reflectometry (AN 1304-7)
Techniques for achieving the highest possible accuracy and resolution in signal integrity impedance measurements
Application Note 2003-10-27 |
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High-Precision TDR with the Agilent 86100 DCA & Picosecond Pulse Labs 4020 Source Enhancement Module
Learn how to build a high-precision time-domain reflectometry/time-domain transmission measurement system.
Application Note 2003-09-12 |
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Measuring Characteristic Impedance of Short Rambus Motherboard Traces (AN 1304-4)
This application note tells you how to perform characteristic impedance measurements on Rambus motherboards and SO-RIMM's using TDR with normalization and verification.
Application Note 2000-11-01 |
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Optical Spectrum Analyzer Amplifier Test Application (PN 86140-5)
The product note explains how the Agilent OSA amplifier test application provides a cost-effective solution for reducing test time.
Application Note 2002-03-15 |
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Time Domain Reflectometry Theory - Application Note
When compared to other measurement techniques, time domain reflectometry provides a more intuitive and direct look at the DUT's characteristics.
Application Note 2013-05-31 |
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