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Evaluating Microstrip with Time Domain Reflectometry (AN 1304-1) 
This application note discusses microstrip transmission line techniques that were evaluated using TDR measurements.

Application Note 2000-11-01

PDF PDF 349 KB
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High Precision Time Domain Reflectometry (AN 1304-7) 
Techniques for achieving the highest possible accuracy and resolution in signal integrity impedance measurements

Application Note 2003-10-27

PDF PDF 3.72 MB
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High-Precision TDR with the Agilent 86100 DCA & Picosecond Pulse Labs 4020 Source Enhancement Module 
Learn how to build a high-precision time-domain reflectometry/time-domain transmission measurement system.

Application Note 2003-09-12

PDF PDF 288 KB
Magneto-Optical Disk Drive Research (PN 3) 
This 4-page Product Note describes how the Agilent 81100 family of pulse/pattern generators can be used together with an Agilent Infinium oscilloscope to help magneto-optical disk drive.

Application Note 2004-07-29

PDF PDF 275 KB
Measuring Characteristic Impedance of Short Rambus Motherboard Traces (AN 1304-4) 
This application note tells you how to perform characteristic impedance measurements on Rambus motherboards and SO-RIMM's using TDR with normalization and verification.

Application Note 2000-11-01

PDF PDF 426 KB
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Time Domain Reflectometry Theory (AN 1304-2) 
This application note discusses the fundamentals of TDR and then relates these fundamentals to the parameters that can be measured in actual test situations.

Application Note 2002-08-29

PDF PDF 190 KB
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