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101-125 / 217
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In-System Programming on the Agilent 3070
In-System Programmable devices are more widely used on today's boards to provide flexibility to design engineers and to reduce the cost of a product.
應用手冊 2001-07-02 |
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205 KB
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Instructions for Using One Confirmation and Adjustment Panel with Multiple Systems
Readjusting the thickness table setting for one machine, using the Confirmation and Adjustment Panel, and adjustment data for a second machine, improves the portability of applications between the two machines.
應用手冊 2004-08-26 |
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Learned Data for the 5DX
The Agilent 5DX uses learned data in several ways to improve algorithm performance. There are basically 2 different forms of learned data.
應用手冊 2000-11-01 |
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Life and Stability of the Agilent 5DX Sealed X-ray Tube
Agilent has developed a sealed ultra-high vacuum X-ray tube that provides stable output throughout a significantly long life.
應用手冊 2007-01-22 |
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78 KB
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Linearization of Multi-Carrier Power Amplifier via Digital Predistortion in ADS
This Application Bulletin describes a method for using digital predistortion in Advanced Design System with the Linearization Design Guide to minimize spectral regrowth in wireless systems.
應用手冊 2009-03-19 |
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Loop Gain Measurements with the 3577A Network Analyzer (PN35772A-2)
Part Number: 3677-5131 (Mar83).
The 3577A is no longer sold by Agilent; this product note is provided for information only.
應用手冊 1983-03-01 |
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248 KB
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Low Cost Mixer for the 10.7 to 12.8 GHz Direct Broadcast Satellite Market (AN 1136)
This Application Note is for information only. Agilent no longer sells or supports these products.
應用手冊 1999-11-01 |
PDF
54 KB
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Magneto-Optical Disk Drive Research (PN 3)
This 4-page Product Note describes how the Agilent 81100 family of pulse/pattern generators can be used together with an Agilent Infinium oscilloscope to help magneto-optical disk drive.
應用手冊 2004-07-29 |
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275 KB
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Maintaining Power with Dual Stage Fixtures
Occasionally there is a need to do dual stage fixturing where power must be maintained during parts of both stages.
應用手冊 2002-06-07 |
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48 KB
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Making Conducted and Radiated Emissions Measurements
This application note provides an overview of radiated and conducted emissions measurements as well as a methodology for EMI precompliance testing.
應用手冊 2010-07-13 |
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1.90 MB
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Making Fuel Cell ac Impedance Measurements Utilizing Agilent N3300A Series Electronic Loads (PN...
This 12-page product note discusses making ac impedance measurements on fuel cells that can help identify problems with the fuel cell components and help identify deviations in the fuel cell assembly process.
應用手冊 2002-02-15 |
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320 KB
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Making the Most of Agilent Throughput Multiplier on Medalist In-Circuit Test Systems
Agilent Throughput Multiplier reduces test time on in-circuit test systems by testing up to four boards of a single-board-type panel simultaneously. The tips in this application note will help users make the most of this valuable tool.
應用手冊 2007-10-12 |
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Managing High-Power DC Requirements for Life and Durability Test Systems
New product life and durability testing (Life testing) is critical in highly competitive markets.
應用手冊 2009-08-04 |
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181 KB
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Maximising Test Coverage with Agilent Medalist VTEP v2.0
This paper describes how to get the most from Agilent Technologies’ industry-leading vectorless test innovation, the Medalist VTEP v2.0 which is a suite of solution comprising VTEP, iVTEP and NPM.
應用手冊 2007-04-17 |
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Measuring Characteristic Impedance of Short Rambus Motherboard Traces (AN 1304-4)
This application note tells you how to perform characteristic impedance measurements on Rambus motherboards and SO-RIMM's using TDR with normalization and verification.
應用手冊 2000-11-01 |
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Measuring Switching Power Supply Stability with the HP 3562A (AN 243-2)
This Application Note is for information only. Agilent no longer sells or supports these products.
應用手冊 1987-02-01 |
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296 KB
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Medalist i3070 In Circuit Test – Utilizing the most comprehensive Limited Access
This article introduces the seven most prominent and effective limited access tools on the Agilent Medalist i3070 ICT, collectively known Super 7 suite.
應用手冊 2009-03-06 |
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342 KB
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Medalist SP50 User Tips for Nominal Paste Factor Field
Registered users, on valid support contracts, can login to learn about how using the Nominal Paste Factor appropriately can improve the system measurement results on the Medalist SP50 Solder Paste Inspection System.
應用手冊 2007-10-11 |
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Microwave Component Measurements - Mixer Measurements using the Scalar Network Analyzer (AN 345-2)
This Application Note is for information only. Agilent no longer sells or supports these products.
應用手冊 1987-05-01 |
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1.13 MB
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Mobile Communications Device Testing (AN 1310)
Pulsed battery drain currents, regulated charge currents, and remote DUT fixtures, dictate the need for specialized power sourcing, loading, and measurement capabilities for testing mobile communications devices.
應用手冊 2007-01-16 |
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251 KB
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NDF and RTF - Hashed Names
There have been many questions about hashed directory names. This is a brief explanation of why they are, and how they are generated.
應用手冊 1998-06-30 |
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Network Analysis - Balanced Measurement Example: Differential Amplifiers (1373-7)
This Application Note describes Agilent balanced-measurement solutions they have developed that offer the most accurate method available for measuring differential RF circuits.
應用手冊 2001-09-10 |
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Network Analysis - Filter And Amplifier Measurement Examples (AN 1287-4)
The network analyzer is used for a variety of device and component characterization tasks in both laboratory and production environments.
應用手冊 2000-08-01 |
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80 KB
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Network Analysis - Mixers - Characterize Frequency-Translating Devices (AN 1287-7)
This Application Note explores current test equipment solutions and techniques that can be used to accurately characterize and test frequency-translating devices.
應用手冊 2000-03-01 |
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Network Analysis Basics - 10 Hints for Making Better Network Analyzer Measurements (AN 1291-1B)
This Application Note contains hints to help you understand and improve your use of network analyzers, and a summary
of network analyzers and their capabilities.
應用手冊 2001-09-17 |
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