元件與特定裝置
縮小範圍
移除所有細分依應用
- 汽車傳動系統與混合電子系統 (14)
- 燃料電池電氣測試 (2)
- Solar Micro Inverter Testing (2)
- Solar Cells & Modules (5)
- 放大器 (25)
- 電池 (14)
- 印刷電路板 (104)
- 天線量測 (11)
- 元件建模與特性分析 (1)
- 濾波器 (1)
- 混頻器、變頻器與調變器 (25)
- Oscillators (3)
依內容類型
依產品分類
126-150 / 217
|
Network Parameter Measurement: Best Practices using the Agilent Medalist i3070
This paper describes how to maximize benefits from the Network Parameter Measurement capability on the Agilent Medalist i3070 in-circuit test system using enhancements in software version 7.20p.
應用手冊 2009-04-02 |
PDF
55 KB
|
|
New Features in Version 5.0 Software for 3070
Typically, when Agilent's Manufacturing Test Division introduces a new software revision for its flagship 3070 In-Circuit Tester, it only communicates with customers about the major new features.
應用手冊 2003-01-28 |
PDF
84 KB
|
|
Non-Contact Measurement Method for 13.56 MHz RFID Tags Using the ENA/ENA-L Network Analyzer
For engineers working in RFID antenna design and test, this note discusses a non-contact method for measuring resonant frequencies of RFIDs using a network analyzer.
應用手冊 2009-02-20 |
PDF
199 KB
|
|
Non-Volatile Memory Programming on the Agilent 3070
The trend in non-volatile memory, like the general trend in electronic products, is to increase capability, reduce size, reduce cost, and get the final product to market faster than the competition.
應用手冊 2003-05-29 |
PDF
28 KB
|
|
Obtaining a Listing of Applications on Series II Systems
There is currently no easy way to obtain a list of all resident applications on a 5DX System or TDW. It is difficult to match panel name with hash name and see when the application was last updated.
應用手冊 2002-06-01 |
|
|
Optical Spectrum Analyzer Amplifier Test Application (PN 86140-5)
The product note explains how the Agilent OSA amplifier test application provides a cost-effective solution for reducing test time.
應用手冊 2002-03-15 |
PDF
642 KB
|
|
Optimizing Bluetooth Device Battery Drain Measurements in Manufacturing (AN 1396)
This application note discusses optimizing battery drain measurements in manufacturing test for Bluetooth devices.
應用手冊 2002-04-03 |
|
|
Optimizing Power Savings on WiMax and Other Cellular WWAN Interface Devices
This document describes how to optimze power savings on WiMax and other cellular WWAN interface devices.
應用手冊 2008-07-15 |
|
|
Performing Two-Tone Measurements with the Agilent 8360 (PN 8360-4)
This Product Note illustrates how to use two Agilent 8360 synthesized sweepers to obtain two tracking signals offset by a fixed frequency (fixed offset).
應用手冊 2001-01-11 |
PDF
84 KB
|
|
Phased Locked Loop Acquisition Using a Swept Local Oscillator
This Application Note details the Phased Locked Loop Acquisition Using a Swept Local Oscillator.
應用手冊 2000-03-02 |
|
|
PLD Programming on the Agilent 3070 Using the PLD ISP Product
In-System Programmable PLDs are more widely used on today's boards to provide flexibility to design engineers and to reduce the cost of a product.
應用手冊 2002-02-26 |
PDF
242 KB
|
|
PLL’s using a Charge Pump, High Divide-by-N Factors, and Decimation before Plotting
This Application Note shows an approach for designing a phase locked loop (PLL) that uses a charge pump, High Divide-by-N Factors, and Decimation before Plotting.
應用手冊 2001-03-20 |
|
|
PLR and 5DX Customized Defect Names Implementation
You can use customized defect names on both the 5DX and on the PLR. This is particularly valuable when you want to display defect names in a local language.
應用手冊 2003-03-01 |
|
|
PNA - Antenna - Pulsed Measurements
This paper presents advances in the instrumentation techniques that can be used for the
measurement and characterization of antennas that are to be tested in a pulsed mode of operation.
應用手冊 2004-01-06 |
|
|
PNA - Antenna Measurement Triggering
應用手冊 2003-05-28 |
|
|
PNA - Antenna/RCS - Reduce Measurement Test Times
This white paper describes new technology features applicable to antenna/RCS measurements, configuration diagrams, typical antenna/RCS measurement scenarios, and measurement time comparisons.
應用手冊 2004-12-20 |
|
|
PNA - Mixers - Absolute Group Delay of Multistage Converters
This paper describes new calibration and measurement techniques for measuring absolute group delay of frequency converters with multiple mixing stages
應用手冊 2003-11-24 |
|
|
PNA - Mixers - Advances in Converter Test
Agilent 2005 Aerospace Defense Symposium presentation
應用手冊 2006-04-24 |
PDF
2.12 MB
|
|
Practical Noise-Figure Measurement and Analysis for Low-Noise Amplifier Designs (AN 1354)
This Application Note is a timely and detailed examination of the process needed for making practical noise figure measurements of low-noise amplifiers which includes software modeling.
應用手冊 2000-09-01 |
PDF
1.65 MB
|
|
Practical RF Amp. Design Using the Available Gain Procedure & the ADS EM/Circuit Co-Sim. Capability
This white paper features a method of designing a low noise RF amplifier for an 802.11b receiver application and contains an Avago ATF54143 PHEMT transistor.
應用手冊 2009-06-25 |
|
|
Preparing a .cc File for Export to Test Link
This procedure describes the process of converting ECAD data into a form that can be used by Test Link.
應用手冊 2002-10-16 |
PDF
70 KB
|
|
Printed Circuit Board Split-Pad Test Method and Design
This application note describes the split-pad concept for use with a bed of nails style test fixture.
應用手冊 1999-06-01 |
PDF
50 KB
|
|
Problem with Subtype Learning When Used with the Connector Algorithm in R7.0
5DX Technical Paper - Problem with Subtype Learning When Used with the Connector Algorithm in R7.0
應用手冊 2004-02-20 |
PDF
16 KB
|
|
Quad Flat No Lead (QFN) Best Practices
The purpose of this application note and best practices guide is to describer the QFN-type component and provide testing methods to ensure robust testing on the Medalist 5DX Automated X-ray Inspection (AXI) System.
應用手冊 2008-08-26 |
PDF
492 KB
|
|
Realizing the Benefits of 3D Inline Solder Paste Inspection
Published in SMT Magazine/Germany, August 2003
應用手冊 2003-08-01 |
PDF
67 KB
|
註冊myAgilent
註冊您的產品
為何選擇向安捷倫採購