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Agilent EEsof EDA 客户教育与服务 
Brief overview of Agilent EEsof EDA Customer Education and Services.

培训资料 2012-02-02

 
约翰霍普金斯大学 MMIC 设计--课程 EE787 
MMIC Design graduate Electrical Engineering course taught by Craig Moore and John Penn.

培训资料 2012-02-02

 
自动测试解决方案提升无线移动设备设计验证效率 
customer viewable presentation

培训资料 2008-04-15

PDF PDF 773 KB
Agilent EEsof EDA Customer Education and Services 
Brief overview of Agilent EEsof EDA Customer Education and Services.

培训资料 2010-08-11

 
Antenna Measurement Basics 
Review the terminology, measurement types, errors sources and test considerations. Reprinted with the permission of Orbit/FR Inc.

培训资料 2004-03-03

PDF PDF 1.11 MB
Automated Stimulus & Current Drain Analysis for Validating/Optimizing Mobile Device Run Time 
customer viewable presentation

培训资料 2008-04-15

PDF PDF 773 KB
Boundary Scan Online Training 
Get up to speed on boundary scan! Access online training materials for boundary scan from the comfort of your desk!

培训资料 2010-01-28

 
Boundary Scan Test Methods for DDR Memories  
In-circuit testing of DDR Memories has become increasingly difficult. This webcast discusses methods of DDR test development and debug.

培训资料 2011-03-28

 
Cheetah PNA RCS and Antenna Measurement System Presentation 
View the presentation on Cheetah PNA RCS and Antenna Measurement Systems. Reprinted with the permission of SPC Corp.

培训资料 2004-03-25

PDF PDF 2.29 MB
DfT rules for boundary scan during ICT 
Learn about the design for test rules for boundary scan used at in-circuit test, that can help you create a good test, minimizing the time and effort needed for debugging while maximizing the efficiency of your test.

培训资料 2009-12-01

PDF PDF 276 KB
Genesys Workspaces Companion for Microwave and RF Engineering Text Book 
Get the Genesys workspaces download for Ali Behagi and Steven Turner's text book, "Microwave and RF Engineering: An Eletronic Design Automation Approach".

培训资料 2013-06-10

 
Near-field vs. Far-field 
Review the tradeoffs and advantages of either a near field or far field antenna test solution. Reprinted with the permission of NearField Systems Inc.

培训资料 2004-03-03

PDF PDF 582 KB
New Tools For Optimizing Operating Time of Mobile Wireless Devices 
Explore challenges of measuring battery current consumption in design validation of next generation digital communications devices including 2.5/3G handsets, Wireless LAN, and Bluetooth technology.

培训资料 2002-06-25

 
Surviving State Disruptions Caused by Test: the "Lobotomy Problem” 
Boundary scan test may affect the logic states of a device as it switches between core logic operation to test mode operation. This webcast puts forth proposals to restore the logic state to a defined state after testing.

培训资料 2010-12-21