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* AMF2013 - 7月開催 / トレーニング・コース一覧 
アジレント電子計測　有料トレーニングコース一覧

トレーニング資料 2013-05-07

 
移動無線機器用のバッテリ・ドレインの特性評価の解析 
このセミナーは、2.5/3Gハンドセット、無線LANおよびBluetoothデバイスなどの次世代通信機器のデザイン検証を担当するエンジニア向けです。

トレーニング資料 2002-08-27

 
Agilent EEsof EDA Customer Education and Services 
Brief overview of Agilent EEsof EDA Customer Education and Services.

トレーニング資料 2010-08-11

 
Antenna Measurement Basics 
Review the terminology, measurement types, errors sources and test considerations. Reprinted with the permission of Orbit/FR Inc.

トレーニング資料 2004-03-03

PDF PDF 1.11 MB
Automated Stimulus & Current Drain Analysis for Validating/Optimizing Mobile Device Run Time 
customer viewable presentation

トレーニング資料 2008-04-15

PDF PDF 773 KB
Boundary Scan Online Training 
Get up to speed on boundary scan! Access online training materials for boundary scan from the comfort of your desk!

トレーニング資料 2010-01-28

 
Boundary Scan Test Methods for DDR Memories  
In-circuit testing of DDR Memories has become increasingly difficult. This webcast discusses methods of DDR test development and debug.

トレーニング資料 2011-03-28

 
Cheetah PNA RCS and Antenna Measurement System Presentation 
View the presentation on Cheetah PNA RCS and Antenna Measurement Systems. Reprinted with the permission of SPC Corp.

トレーニング資料 2004-03-25

PDF PDF 2.29 MB
DfT rules for boundary scan during ICT 
Learn about the design for test rules for boundary scan used at in-circuit test, that can help you create a good test, minimizing the time and effort needed for debugging while maximizing the efficiency of your test.

トレーニング資料 2009-12-01

PDF PDF 276 KB
Near-field vs. Far-field 
Review the tradeoffs and advantages of either a near field or far field antenna test solution. Reprinted with the permission of NearField Systems Inc.

トレーニング資料 2004-03-03

PDF PDF 582 KB
Surviving State Disruptions Caused by Test: the "Lobotomy Problem” 
Boundary scan test may affect the logic states of a device as it switches between core logic operation to test mode operation. This webcast puts forth proposals to restore the logic state to a defined state after testing.

トレーニング資料 2010-12-21