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RF & Microwave

For most of your RF & Microwave measurement needs, you can find application & solution information here.

Be sure to check the library of application notes for detailed information on using your equipment and successfully completing the measurements you need.

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346A/B/C Noise Sources: 10 MHz to 26.5 GHz 
The attached document provides technical data for the Agilent 346A, 346B, and 346C Noise Sources ranging from 10 MHz to 26.5 GHz.

Application Note 2000-12-01

PDF PDF 500 KB
4 Steps for Making Better Power Measurements (AN 64-4D) 
Before selecting a power meter and associated sensors, make sure that you have taken the 4 steps detailed in this note, which influence the accuracy, economy and technical match to your application.

Application Note 2006-04-26

PDF PDF 995 KB
Langues 
5370B Universal Time Interval Counter (AN 191-7) 
This Application Note is for information only. Agilent no longer sells or supports these products.

Application Note 1987-06-01

PDF PDF 8.34 MB
8 Hints for Making Better Spectrum Analyzer Measurements (AN 1286-1) 
This application note provides eight pertinent hints for making better spectrum analyzer measurements such as measuring low level signals and indentifying internal distortion products.

Application Note 2009-09-07

PDF PDF 739 KB
Langues 
89400 Series Vector Signal Analyzer Understanding Time and Frequency Domain Interactions  
The intent of this Product Note is to provide a more intuitive feel for interactions among the time and frequency setup parameters of the Agilent 89400 Vector Signal Analyzers.

Application Note 2000-09-01

PDF PDF 159 KB
Langues 
A New Technique for Pulsed RF Measurements (AN 120) 
This Application Note is for information only. Agilent no longer sells or supports these products.

Application Note 1968-09-01

PDF PDF 815 KB
Applications and Operations of the 8970A Noise Figure Meter (PN8970A-1) 
Part Number: 08970-99000 (Nov81). The 8970A is a discontinued product; this product note is provided for information only.

Application Note 1981-11-01

PDF PDF 7.65 MB
Basic Microwave Measurements (AN 27) 
This Application Note is for information only. Agilent no longer sells or supports these products.

Application Note 1965-08-01

PDF PDF 1.37 MB
Characterizing Clock Jitter through Phase Noise Measurements Speeds up Design Verification Process 
This white paper discusses a new measurement method for obtaining highly accurate low random jitter (RJ) measurements and performing real-time analysis of RJ and periodic jitter (PJ) of components.

Application Note 2008-11-20

PDF PDF 688 KB
Langues 
Choosing the Right Power Meter and Sensor 
This product note outlines applications considerations and the newest sensor technologies. It also reviews the families of thermocouple, diode and two-path, diode-attenuator-diode sensors.

Application Note 2000-10-01

PDF PDF 433 KB
Langues 
Evaluation of MOS Capacitor Gate Oxide C-V Characteristics Using the Agilent 4294A(PN4294-3) 
As a result of extremely high integration of logic LSIs, MOS FETs with gate lengths of 0.1 mm or less have been produced recently. A consequence of this miniaturization has been the need for very thin gate oxide layers.

Application Note 2003-06-26

PDF PDF 1.01 MB
Langues 
Extending Vector Signal Analysis to 26.5 GHz with 20 MHz Information Bandwidth (PN 89400-13) 
This Product Note shows you how to configure, calibrate and operate a measurement system capable of wide bandwidth (up tp 20 MHz) vector signal analysis using the 89410A VSA & the 71910A Wideband Surveillance Receiver.

Application Note 2000-10-01

PDF PDF 569 KB
Fundamentals of RF and Microwave Noise Figure (AN 57-1) 
This 32-page, black-and-white application note providesinformation on RF and Microwave noise figure measurementts. Topics include noise figure and temperature, noise characteristics of two-port networks, and the measurement of noise figure.

Application Note 2010-08-05

PDF PDF 864 KB
Langues 
Fundamentals of RF and Microwave Power Measurements (AN 64-1C) 
This Application Note is for information only. Agilent no longer sells or supports these products.

Application Note 2001-04-16

PDF PDF 2.21 MB
Fundamentals of RF and Microwave Power Measurements (AN 1449) 
Agilent's Fundamentals of RF and Microwave Power Measurements, application note (AN 1449-1/2/3/4).

Application Note 2009-06-05

 
Fundamentals of Time Interval Measurements (AN 200-3) 
This classic Application Note provides a fundamental background on measurements of time-related events with electronic time interval counters. This Application Note is for information only. Agilent no longer sells or supports these products.

Application Note 1997-06-01

PDF PDF 897 KB
Langues 
Impedance Measurement Handbook 
Impedance measurements basics using Agilent Technologies' LCR meters and impedance analysers.

Application Note 2009-06-17

PDF PDF 2.02 MB
Langues 
Introduction to Microwave Measurements (AN 46) 
This Application Note is for information only. Agilent no longer sells or supports these products.

Application Note 1960-09-01

PDF PDF 12.98 MB
Investigating Bluetooth Modules: The First Step in Enabling Your Device with a Wireless Link 
This Application Note is designed for vendors or manufacturers who plan to add a wireless link to their products by installing commercially-available, pre-built Bluetooth® modules into them.

Application Note 2001-09-30

PDF PDF 1.36 MB
Langues 
Log Sweep with the 3582A Spectrum Analyzer (AN 245-5) 
This Application Note is for information only. Agilent no longer sells or supports these products.

Application Note 1979-06-01

PDF PDF 858 KB
Measurement of Cable Characteristics (AN 30) 
This Application Note is for information only. Agilent no longer sells or supports these products.

Application Note 1964-02-01

PDF PDF 586 KB
More on Spectrum Analysis (AN 63A) 
This Application Note is for information only. Agilent no longer sells or supports these products.

Application Note 1965-06-01

PDF PDF 4.59 MB
Multifrequency C-V Measurements of Semiconductors (AN 369-5) 
The Agilent 4284A has a DC bias capability of +/- 40V and a wide frequency cover age of 20 Hz - 1 MHz, which enable us to make semiconductor C-V measurements.

Application Note 2008-12-10

PDF PDF 283 KB
Langues 
Network, Spectrum, and Impedance Evaluation of Electronic Circuits and Components (AN 1308-1) 
This Application Note describes how the Agilent 4395A/96B can be used to contribute fast cycle time for electronic circuit/component development.

Application Note 2001-12-19

PDF PDF 666 KB
Langues 
Noise Figure Measurement Accuracy - The Y-Factor Method - Application Note 
Noise figure is a key performance parameter in many RF systems. This application note covers many topics related to noise figure measurements including the Y-factor method.

Application Note 2013-04-12

PDF PDF 1.36 MB

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