Optical & Photonic

On-Wafer Testing of Opto-Electronic Components Using LCA's This document describes the principles of on-wafer measurements on opto-electronic components Application Note 2008-08-13	PDF 1.57 MB Languages English \| 2008-08-13 \| PDF 1.57 MB 中文（简体） \| 2008-12-01 \| PDF 1.78 MB
101 of high speed optical component characterization The application note gives you deep insight into the basics of electro-optical S-parameter test with the Lightwave Component Analyzer (LCA). Application Note 2008-01-18	PDF 1.93 MB Languages English \| 2008-01-18 \| PDF 1.93 MB 日本語 \| 2008-03-11 \| PDF 3.89 MB