Fundamentals of Electronic Test & Measurement

Browse the application notes, seminars, and training classes here for measurement techniques.
Be sure to visit our forums for the latest discussions.

Jitter Fundamentals: Jitter Tolerance Testing with Agilent ParBERT 81250 This applicaiton note describes gain fast and efficient insight into the operation and performance of CDR, clock system and jitter tolerance. Application Note 2003-12-02	PDF 3.18 MB
Jitter Analysis Techniques for High Data Rates (AN 1432) This new application note describes the basic jitter measurements and the specific measurement techniques used in SONet/SDH/OTN and Gigabit Ethernet applications. Application Note 2003-02-03	PDF 4 MB Languages English \| 2003-02-03 \| PDF 4 MB 日本語 \| 2003-04-28 \| PDF 1.65 MB
How to use the Agilent 81200 together with Agilent VEE This attached Product Note shows how to use the Agilent 81200 Data Generator/Analyzer together with Agilent VEE for Signal Integrity Analysis. Application Note 2002-01-28	PDF 383 KB