Oscillators
Agilent provides solutions for oscillator design and test needs.
Design oscillators with a comprehensive array of design and synthesis tools including examples, templates, DesignGuides, and industry-leading simulators. Agilent EDA software products such as Advanced Design System (ADS) and Genesys include various tools that can help streamline the design process by optimizing critial characteristics such as timing, phase noise, and frequency stability.
Once your design is complete and you have a prototype developed, Agilent offers Oscilloscopes, Spectrum Analyzers and other measurement tools to help measure and verify your design.
Refine the List
By Type of Content
- Seminar Materials (1)
- Tradeshow (1)
- Seminar (2)
- Webcast - recorded (2)
By Product Category
-
All Product Categories
-
Oscilloscopes, Analyzers, Meters
- Oscilloscopes (2)
- Spectrum Analyzers (Signal Analyzers) (4)
- Network Analyzers (6)
- Handheld Oscilloscopes, Analyzers, Meters (4)
- Logic Analyzers (2)
- Protocol Analyzers and Exercisers (2)
- EMI/EMC, Phase Noise, Physical Layer Test Systems (3)
- Bit Error Ratio Test (BERT) Solutions (2)
- Digital Multimeters (DMM) (2)
- Power Meters & Power Sensors (2)
- Frequency Counter Products (2)
- Noise Figure Analyzers & Noise Sources (3)
- LCR Meters & Impedance Measurement Products (4)
- Digitizers (2)
- DC Power Analyzers (2)
- Dynamic Signal Analyzers, Materials Measurement (2)
- Parameter & Device Analyzers, Curve Tracer (2)
-
Oscilloscopes, Analyzers, Meters
1-6 of 6
|
Eventi di Agilent Italia
Benvenuti nella pagina degli eventi di Agilent Italia
Seminar |
|
|
Discrete Oscillator Design Tools and Techniques
Originally broadcast Sept. 16, 2010
Webcast - recorded |
|
|
EMC 2013 - IEEE International Symposium on Electromagnetic Compatibility
August 5- 9, 2013; Denver, CO
Tradeshow |
|
|
Innovations in EDA: A Practical Approach to Verifying RFICs with Fast Mismatch Analysis
A new fast mismatch analysis that delivers the same level of accuracy with the benefit of significantly reducing overall cost, verification time and increased computed resource availability.
Seminar Materials 2010-10-29 |
|
|
RF and Microwave Education Series
2013 Webcast Series
Webcast - recorded |
|
|
Test & Measurement events in Europe, Middle East & Africa
Test & Measurement events in Europe, the Middle East, and Africa - seminars, trade shows, user group meetings, webcasts, tutorials and conferences.
Seminar |
