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Premier Si/III-V Device Modeling and Characterization Solutions

Agilent provides premier solutions for characterization and modeling of cutting-edge CMOS and compound semiconductor devices. Agilent is the only vendor that provides complete end-to-end modeling solutions, from automated measurements, accurate device model extraction, comprehensive qualification to final process design kit (PDK) validation. Comprehensive modeling services are offered, supported by Agilent’s expert engineers and advanced labs. Some of our key device modeling and characterization EDA software solutions include:

  • IC-CAP: A versatile and user programmable industry standard for semiconductor device modeling
  • IC-CAP WaferPro: Fast and accurate automated measurement software
  • Model Builder Program (MBP): Complete Silicon turnkey device modeling software
  • Model Quality Assurance (MQA): Industry standard SPICE model signoff and acceptance software

Device modeling and characterization challenges

  • As device geometries get smaller, the need to use accurate models and to control statistical variations in device processing performance becomes ever more important
  • Circuit designers need models that can accurately predict DC behaviors, as well as RF and noise behaviors
  • Different process technologies require a variety of models that can be quickly adapted to the unique processes
  • With modeling measurements taking hours or even days, measurement control software must also work with probers and instruments to allow automated measurements across temperature

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2014 Agilent EEsof EDA Training Course Calendar 
Scheduled Agilent EEsof courses for the United States and Canada

Formation en classe

 
Advanced Product Design & Test for High-Speed Digital Devices Webcast 
Original broadcast Jan 18, 2012

Webcast - enregistré

 
Agilent EEsof EDA Customer Education and Services 
Brief overview of Agilent EEsof EDA Customer Education and Services.

Matériel de formation 2010-08-11

 
Automating On-Wafer Measurements with the new Agilent IC-CAP WaferPro 
Originally broadcast Jan 27, 2011

Webcast - enregistré

 
Automating SPICE Library Validation 
Recorded webcast and slide set for a Model Quality Assurance (MQA) webcast held on October 22, 2013.

Présentation de séminaire 2013-10-22

 
Breakthrough in High Speed Interconnect Analysis and Compliance Testing  
Originally broadcast April 27, 2011

Webcast - enregistré

 
Design Automation Conference (DAC) 2014 
June 2-4, 2014; San Francisco, CA

Salon professionnel

 
DesignCon 2011 CD of Agilent Education Forum Workshops and Presentations 
Order free CD of the 2011 Agilent Education Forum Workshops and Presentations

Salon professionnel

 
DesignCon 2014 
Jan 28-31, 2014; Santa Clara Convention Center Download papers presented, order the AEF DVD

Salon professionnel

 
Fundamentals of Fast Pulsed IV Measurement Webcast 
Original broadcast January 9, 2014

Webcast - enregistré

 
Fundamentals of Semiconductor Capacitance Measurement Webcast 
Original broadcast October 29, 2013

Webcast - enregistré

 
Genesys Webcasts - "How-To-Design" series  
Originally broadcast in 2009. Access the 6 WebEX recordings

Webcast - enregistré

 
Hybrid-Active Load Pull with PNA-X and Maury Microwave 
Original broadcast Jun 12, 2012

Webcast - enregistré

 
IC-CAP User Training 
This 3-day course will show device modelers how to use Agilent EEsof EDA's IC-CAP software. Click on link to view full course description and class dates and locations.

Formation en classe

 
Innovations in EDA: Accurate Modeling of GaAs & GaN HEMT’s for Nonlinear Applications Webcast 
Original broadcast May 7, 2013

Webcast - enregistré

 
International Microwave Symposium (IMS) 2014 
June 1-16, 2014; Tampa Bay, Florida

Salon professionnel

 
Latest Developments in Device Characterization and Modeling for Advanced CMOS and III-V Technologies 
Santa Clara, CA - May 29, 2014

Séminaire

 
Measurement Based FET Modeling using Artifical Neural Networks (ANN) 
This presentation was given by Jianjun Xu with introduction by David Root as part of the Innovations in EDA Webcast Series.

Présentation de séminaire 2012-02-07

PDF PDF 2.51 MB
MQA: Automating Library Validation 
MQA is the industry standard qualification platform that assists modeling experts and model users to perform comprehensive model qualification with an knowledge-based, rules-driven approach.

Présentation de séminaire 2013-10-22

PDF PDF 1.48 MB
New impedance measurement solutions & apps using 5 Hz to 3 GHz VNA  
Originally broadcast April 19, 2011

Webcast - enregistré

 
New Wide Band Gap High-Power Semiconductor Measurement Techniques Webcast 
Live broadcast July 31, 2013; 11am PT/2pm ET

Webcast

 
Nonlinear Characterization and Modeling Through Pulsed IV/S-Parameters  
Original broadcast Mar 27, 2012

Webcast - enregistré

 
Optimizing PXI Modular Functional Test System Throughput Webcast 
Originally broadcast April 27, 2011

Webcast - enregistré

 
PCI Express(R) 3.0 Strategies for Transmitter and Receiver Validation 
Originally broadcast Feb 10, 2011

Webcast - enregistré

 
RF Back to Basics Seminar - 2014 
Various cities in the US

Séminaire

 

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