Premier Si/III-V Device Modeling and Characterization Solutions
Agilent provides premier solutions for characterization and modeling of cutting-edge CMOS and compound semiconductor devices. Agilent is the only vendor that provides complete end-to-end modeling solutions, from automated measurements, accurate device model extraction, comprehensive qualification to final process design kit (PDK) validation. Comprehensive modeling services are offered, supported by Agilent’s expert engineers and advanced labs. Some of our key device modeling and characterization EDA software solutions include:
- IC-CAP: Most powerful III-V/RF modeling platform
- IC-CAP WaferPro: Fast and accurate automated measurement platform
- Model Builder Program (MBP): Complete Silicon turnkey device modeling platform
- Model Quality Assurance (MQA): Industry standard SPICE model signoff and acceptance platform
Device modeling and characterization challenges
- As device geometries get smaller, the need to use accurate models and to control statistical variations in device processing performance becomes ever more important
- Circuit designers need models that can accurately predict DC behaviors, as well as RF and noise behaviors
- Different process technologies require a variety of models that can be quickly adapted to the unique processes
- With modeling measurements taking hours or even days, measurement control software must also work with probers and instruments to allow automated measurements across temperature
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Source Measure Units
- B1500A Semiconductor Device Analyzer (4)
- B2900A Series Precision Source/Measure Units (SMU) (2)
- N6781A 2-Quadrant Source/Measure Unit for Battery Drain Analysis, 20 V, ±1 A or 6 V, ±3 A, 20 W (2)
- N6782A 2-Quadrant Source/Measure Unit for Functional Test, 20 V, ±1 A or 6 V, ±3 A, 20 W (2)
- N6784A 4-Quadrant General-Purpose Source/Measure Unit, ±20 V, ±1 A or ±6 V, ±3 A, 20 W (2)
- N6705B DC Power Analyzer, Modular, 600 W, 4 Slots (2)
- N6715B Base Model Custom-Configured DC Power Analyzer, 600 W, Modular, 4 Slots (2)
- B1505A Power Device Analyzer / Curve Tracer (2)
- E5260A 8-Slot High Speed Measurement Mainframe (2)
- E5262A 2-Channel (MPSMU, MPSMU) High Speed Source Monitor Unit (2)
- E5270B 8-Slot Precision Measurement Mainframe (2)
- E5263A 2-Channel (HPSMU, MPSMU) High Speed Source Monitor Unit (2)
- U2722A USB Modular Source Measure Unit (2)
- U2723A USB Modular Source Measure Unit (2)
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Source Measure Units
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Generators, Sources, Supplies
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Agilent eventos en España
Bienvenido a la página de eventos organizados por Agilent en España.
Seminar |
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Automating On-Wafer Measurements with the new Agilent IC-CAP WaferPro
Originally broadcast Jan 27, 2011
Webcast - recorded |
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Setting Up IC-CAP WaferPro For On-Wafer Measurements
originally broadcast June 22, 2011
Webcast - recorded |
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Test & Measurement events in Europe, Middle East & Africa
Test & Measurement events in Europe, the Middle East, and Africa - seminars, trade shows, user group meetings, webcasts, tutorials and conferences.
Seminar |
