器件建模

安捷伦为直流和射频半导体器件表征及建模提供硬件和软件解决方案。当前大多数领先的半导体制造商和集成器件制造商（IDMs）都采用安捷伦工具来获得器件建模方案，以便用于芯片 CMOS、Bipolar、混合砷化镓（GaAs）、氮化镓（GaN）和许多其它器件技术。

器件建模挑战

无源模型程序库发生器（PMLG）的演示 This Presentation by Dr. Thomas Gneiting (Advanced Modeling Solution) was presented at Agilent EEsof EDA Seminar, April 04, 2001 details the structure of BSIM3v3, BSIMSOI and BSIM4 RF models. 研讨会演示 2001-04-04	PDF 1.49 MB
Measurement Based FET Modeling using Artifical Neural Networks (ANN) This presentation was given by Jianjun Xu with introduction by David Root as part of the Innovations in EDA Webcast Series. 研讨会演示 2012-02-07	PDF 2.51 MB
Presentation on BSIM4, BSIM3v3 and BSIMSOI RF MOS Modeling This Presentation by Dr. Thomas Gneiting (Advanced Modeling Solution) was presented at Agilent EEsof EDA Seminar, April 04, 2001 details the structure of BSIM3v3, BSIMSOI and BSIM4 RF models. 研讨会演示 2001-04-04	PDF 1.49 MB
Presentation on DC & AC Characterization of Semiconductors This Presentation focuses on basics of device measurement and modeling techniques from DC to RF, special aspects of network analyzer calibration, de-embedding and required dummy structures. 研讨会演示 2003-01-28	PDF 893 KB
Setting up IC-CAP WaferPro for On-Wafer Measurements IC-CAP WaferProIs is an extremely powerful test plan suite, for on-Wafer DC/CV and RF device modeling measurements. 研讨会演示 2011-06-22	PDF 3.07 MB