高速数字
在您的成功之路上，每一代数字标准的更改都带来新的风险。创建新产品并与像您这样的工程师协同工作时，我们对此深有体会。安捷伦用于进行高速数字测试的解决方案集是仪表和广泛专业技术（建立在我们不断与业界专家进行沟通交流的基础之上）的结合。通过分享我们最新的经验，安捷伦能够帮助您预测挑战和提高创建值得骄傲的产品的能力。安捷伦――实现您的最佳设计。
浏览完整的设计周期
通过浏览本网站，您将能了解到分别适用于设计周期全部四个阶段以及信号完整性分析核心部分的解决方案。
去除所有优化1-14 / 14
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使用 ADS 进行信号完整性优化
This white paper shows how to replace a multi-dimensional sweep of a long running PRBS time-domain simulation (including manual data evaluation) by short, channel-pulse characterization in the Advanced Design System to efficiently optimize a channel.
应用说明 2009-10-19 |
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利用 IBIS-AMI 模型仿真高速串行通道
This paper reviews some of the benefits and limitations of using IBIS models and introduces the new AMI extensions to the latest IBIS version 5.0 specification.
应用说明 2011-11-15 |
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用物理层测试系统和先进设计系统
应用说明 2006-05-01 |
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Designing and Validating High-Speed Memory Buses (AN 1382-2)
DDR SDRAM (double data rate synchronous dynamic random access memory) is quickly becoming an accepted technology in the PC (personal computer) industry. Its low cost, high performance, and increasingly wide availability make it very desirable for PC memory buses and embedded designs such as high...
应用说明 2001-12-20 |
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1.51 MB
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Effective Reflection Characterization for Active Devices Using ENA Option TDR Application Note
This application note describes Hot TDR measurement, which is an effective characterization method for the reflection of transmitter and receiver.
应用说明 2012-01-12 |
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Explore the SERDES Design Space Using the IBIS AMI Channel Simulation Flow
Simulation of modern chip-to-chip links requires you abandon the SPICE-based approach and adopt a new approach based on an IBIS AMI channel simulation flow.
应用说明 2012-09-21 |
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Frequency Domain Analysis of Jitter Amplification in Clock Channels
Clock channel jitter amplification factor in terms of transfer function or S-parameters is derived. Amplification is shown to arise from smaller attenuation in jitter lower sideband than in the fundamental. Amplification scaling with loss is obtained.
应用说明 2012-11-01 |
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257 KB
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Limitations and Accuracies of Time and Frequency Domain Analysis of Physical Layer Devices
应用说明 2005-11-01 |
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2.83 MB
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Signal Integrity Analysis Series Part 1: Single-Port TDR, TDR/TDT, & 2-Port TDR
This Application Note focuses on part 1: those which use a single-port TDR, those which use TDR/TDT, and those which use 2-port TDR.
应用说明 2007-01-01 |
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3.50 MB
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Signal Integrity Analysis Series Part 2: 4-Port TDR/VNA/PLTS
This Application Note focuses on part 2: those which use a 4-port TDR/VNA/PLTS.
应用说明 2007-02-21 |
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2.75 MB
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Signal Integrity Analysis Series Part 3: The ABCs of De-Embedding
This Application Note focuses on Part 3: The ABCs of De-Embedding explaining different de-embedding techniques & shows how to minimize fixture effects for best results.
应用说明 2007-07-01 |
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2.44 MB
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Simulating FPGA Power Integrity Using S-Parameter Models
This application note describes how self-impedance (frequency) can easily be determined by simulating the frequency domain self-impedance profile of a Power Distribution Network (PDN).
应用说明 2012-04-02 |
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5.68 MB
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Using Clock Jitter Analysis to Reduce BER in Serial Data Applications
This Application Note emphasizes on the emerging techniques for reference clock jitter analysis from the perspective of oscillator physics, phase noise theory, and serial data technology.
应用说明 2006-12-01 |
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1.15 MB
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Which Electromagnetic Simulator Should I Use?
This paper outlines three of the key EM simulation technologies, MoM, FEM, FDTD and attempt to compare and contrast the relative merits of each.
应用说明 2012-04-06 |
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3.21 MB
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