Basics & Measurement Fundamentals

Automating On-Wafer Measurements with the new Agilent IC-CAP WaferPro Originally broadcast Jan 27, 2011 Webcast - recorded
Innovations in EDA Webcast: Measurement-based FET modeling using Artificial Neural Networks (ANNs) Original broadcast Feb 2, 2012 Webcast - recorded
Innovations in EDA: Accurate Modeling of GaAs & GaN HEMT’s for Nonlinear Applications Webcast Original broadcast May 7, 2013 Webcast - recorded
Innovations in EDA: Accelerating Radar/EW System Design using Wideband Virtual Scenarios Webcast Original broadcast April 4, 2013 Webcast - recorded
Innovations in EDA: High Performance Digital Pre-Distortion (DPD) for Wideband Systems Original broadcast Sept 1, 2011 Webcast - recorded
Setting Up IC-CAP WaferPro For On-Wafer Measurements originally broadcast June 22, 2011 Webcast - recorded