Long Term Evolution - LTE Test
Accelerate Wireless Design and Test with Flexible, High-Performance Platforms
Agilent gives you “greater insight” into your Long Term Evolution (LTE) designs and LTE Test. We provide reduced design uncertainty, faster and easier development of high-performing LTE products and help you find root causes faster. Now with first-to-market test solutions for LTE-Advanced.
To learn more about LTE technology : LTE Technology Overview
To learn more about the LTE implementation of MIMO: MIMO Test
Receive App Notes, CD's and other resources : Long Term Evolution - LTE Resources
To find the product that fits your stage of Long Term Evolution (LTE) development see links to the left.
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- TD-LTE Design and Test Equipment
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Oscilloscopes, Analyzers, Meters
Bit Error Ratio Test (BERT) Solutions
- 81250 13.5 Gb/s ParBERT Modules (N4872A, N4873A) (2)
- 81250 7 Gb/s ParBERT Modules (N4874A, N4875A) (2)
- 81250 3.35 Gb/s ParBERT Modules (E4861B, E4862B, E4863B) (2)
- 81250 675 Mb/s ParBERT Modules (E4832A, E4835A, E4838A) (2)
- 81250 ParBert (Central Clock Modules for ParBERT 81250 - E4805B, E4808A, E4809A) (2)
- ParBERT 81250
- Bit Error Ratio Test (BERT) Solutions
- Oscilloscopes, Analyzers, Meters
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