X-parameters
Agilent’s X-parameters* functionality represents a new category of nonlinear network parameters for high-frequency design. X-parameters:
- Are applicable to both large-signal and small-signal conditions, and for linear and nonlinear components.
- Characterize the amplitudes and relative phase of harmonics generated by components under large input power levels at all ports.
- Correctly characterize impedance mismatches and frequency mixing behavior to allow accurate simulation of cascaded nonlinear X-parameter blocks, such as amplifiers and mixers in wireless design.
- Functionality was included in the Nonlinear Vector Network Analyzer (NVNA), and the Advanced Design System in 2008.
- X-parameter model support was added to the SystemVue environment in 2010. SystemVue connects X-parameter models into RF system-level analysis, as well as full physical layer baseband/DSP simulations
- X-parameter model support was added to the Genesys RF and Microwave simulation environment for circuit and system design in 2010.
Agilent's X-parameters functionality can help you overcome a key challenge in RF engineering, namely that of nonlinear impedance differences, harmonic mixing, and nonlinear reflection effects that occur when components are cascaded under large signal operating conditions. X-parameters help solve this complex cascading problem: if you measure the X-parameters of a set of components individually, you can calculate the X-parameters and hence the nonlinear transfer function of any cascade made from them. Calculations based on X-parameters are usually performed within a harmonic balance simulator environment.
See Measurement Solution Example: X-Parameter Measurements
* "X-parameters" is a trademark of Agilent Technologies, Inc. The X-parameters format and underlying equations are open and documented. For more information, refer to X-parameters Open Documentation, Trademark Usage & Partnerships.
관련 링크
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Agilent Demonstrates Unrivalled Range of Measurement Solutions at Electronica 2008
보도자료 2008-11-11 |
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Agilent Introduces Breakthrough Technology to Analyze Nonlinear Behaviors of Active Components
보도자료 2008-06-02 |
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Agilent Technologies Announces Breakthrough in X-Parameter Nonlinear Model Generation
Agilent Technologies Announces Breakthrough in X-Parameter Nonlinear Model Generation for Components Used in Wireless, Aerospace Defense Industries
보도자료 2008-12-17 |
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Agilent Technologies Expands World's Most Flexible PNA-X Network Analyzer for Active Device Test
보도자료 2009-06-01 |
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Agilent Technologies Wins More Than 20 Annual Product Awards for Electronic Design, Measurement
보도자료 2009-02-24 |
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Setting a New Standard for Flexible Network Analyzers
보도자료 2009-06-01 |
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X-parameters News
Press Releases related to Agilent's X-parameters
보도자료 2009-08-21 |

