X-parameters
Agilent’s X-parameters* functionality represents a new category of nonlinear network parameters for high-frequency design. X-parameters:
- Are applicable to both large-signal and small-signal conditions, and for linear and nonlinear components.
- Characterize the amplitudes and relative phase of harmonics generated by components under large input power levels at all ports.
- Correctly characterize impedance mismatches and frequency mixing behavior to allow accurate simulation of cascaded nonlinear X-parameter blocks, such as amplifiers and mixers in wireless design.
- Functionality was included in the Nonlinear Vector Network Analyzer (NVNA), and the Advanced Design System in 2008.
- X-parameter model support was added to the SystemVue environment in 2010. SystemVue connects X-parameter models into RF system-level analysis, as well as full physical layer baseband/DSP simulations
- X-parameter model support was added to the Genesys RF and Microwave simulation environment for circuit and system design in 2010.
Agilent's X-parameters functionality can help you overcome a key challenge in RF engineering, namely that of nonlinear impedance differences, harmonic mixing, and nonlinear reflection effects that occur when components are cascaded under large signal operating conditions. X-parameters help solve this complex cascading problem: if you measure the X-parameters of a set of components individually, you can calculate the X-parameters and hence the nonlinear transfer function of any cascade made from them. Calculations based on X-parameters are usually performed within a harmonic balance simulator environment.
See Measurement Solution Example: X-Parameter Measurements
* "X-parameters" is a trademark of Agilent Technologies, Inc. The X-parameters format and underlying equations are open and documented. For more information, refer to X-parameters Open Documentation, Trademark Usage & Partnerships.
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Webcast Slides: X-Parameter Case Study: GaN High Power Amplifier (HPA) Design
This Webcast illustrates a high power (>45 dBm) amplifier design based on X-parameter measurements of a GaN transistor.
Seminar Materials 2011-01-11 |
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Agilent EEsof EDA Customer Education and Services
Brief overview of Agilent EEsof EDA Customer Education and Services.
Training Materials 2010-08-11 |
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Redefine How You Measure & Simulate Nonlinear Devices Using X-Parameters
Seminar Materials 2010-05-26 |
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Accurate Mixer Measurements Using Multi-tone X-parameter Models
IMS 2010 MicroApps presentation by Mihai Marcu and Radoslaw M. Biernacki
Seminar Materials 2010-05-26 |
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X-Parameters
Seminar Materials 2008-12-15 |
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Combining the Power of RF & Microwave with High Speed Digital Seminar Materials
Access the papers from the 2012 Seminar
Seminar |
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Advanced RF/Microwave Measurements Symposium
Canadian seminar tour in Vancouver, BC / Toronto, ON / Ottawa, ON
Seminar |
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Hybrid-Active Load Pull with PNA-X and Maury Microwave
Original broadcast Jun 12, 2012
Webcast - recorded |
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Innovations in EDA: High Performance Digital Pre-Distortion (DPD) for Wideband Systems
Original broadcast Sept 1, 2011
Webcast - recorded |
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Discrete Oscillator Design Tools and Techniques
Originally broadcast Sept. 16, 2010
Webcast - recorded |
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Characterize and Correct for Cable, Switch and Test Fixture Loss Using Only a High-Bandwidth Scope
Originally broadcast July 27, 2011
Webcast - recorded |
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Design of a 8 Watt, High efficiency X-band Power PHEMT Amplifier
Originally broadcast March 16, 2010
Webcast - recorded |
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A Practical Approach to Verifying RFICs with Fast Mismatch Analysis
Originally broadcast October 28, 2010
Webcast - recorded |
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Innovations in EDA: Memory Effects in RF Circuits: Manifestations and Simulation
Originally broadcast Feb 3, 2011
Webcast - recorded |
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Nonlinear Characterization and Modeling Through Pulsed IV/S-Parameters
Original broadcast Mar 27, 2012
Webcast - recorded |
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RF Back to Basics Seminar- 2013
Various cities in the US
Seminar |

