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LXI - LAN eXtensions for Instruments
LAN is everywhere. More and more, so are your test systems. LXI puts the power of Ethernet and the Web inside those systems. By standardizing and extending LAN, LXI offers you new possibilities in system design—local, remote, distributed, time-aware. With LXI, you can create the system you need today—and quickly move forward to the one you need next. LXI: It´s about your time.
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Building Hybrid Test Systems. Ensuring success in two common development scenarios - Application Not
Application Note 1465-33. When you migrate to a hybrid system that includes LXI along with GPIB, VXI, PXI, or any other architecture, two scenarios are most typical, minimum development time and maximum overall performance
Application Note 2008-10-15 |
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Cathodic Protection of Steel in Concrete Using LXI
This document discusss Cathodic protection as a remarkable technique that can substantially extend the life of a building structure by impeding corrosion.
Application Note 2007-04-25 |
PDF
390 KB
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Defining three classes of LAN eXtensions for Instrumentation (LXI)
The LXI standard defines three types of instruments that can be readily mixed and matched within a test system.
Application Note 2006-01-12 |
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Migrating system software from GPIB to LAN/LXI (AN 1465-25) - Application Note
Migrating system software from GPIB to LAN/LXIis the sixth application note in a series designed to help you manage the shift to LXI from GPIB.
Application Note 2007-02-02 |
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Next-generation Test Systems: Advancing the Vision with LXI - Application Note
This white paper provides an introduction to LXI, presents its advantages, and outlines usage models that expand the reach and capabilities-and perhaps the definition of test systems.
Application Note 2006-05-03 |
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Standardized Core Makes Building and Supporting a Functional Test System Easier and Less Costly
This note demonstrates how to use LXI instruments to create a standardized core - the open test platform (OTP), for building test systems.
Application Note 2007-02-23 |
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Using IVI For Your Instrument Driver
This application note describes the use of IVI drivers in your test system to determine when IVI is the right choice
Application Note 2008-11-14 |
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Using LXI to Boost Throughput in Semiconductor Manufacturing
This document is a case study that discusses the successful customer implementation of an Agilent LXI solution for a multinational semiconductor manufacturer
Application Note 2007-04-25 |
PDF
234 KB
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Using Synthetic Instruments in Your Test System (AN 1465-24)
This note represents a brief history of SI, compares a rack-and-stack system to an SI-based system, descibes the initial applications of SIs, and illustrates the emulation of conventional instruments with SIs.
Application Note 2006-08-28 |
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