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高速数字分析

安捷伦强大的分析工具可完成详细的表征

大多数串行数据链路都是以高速 IC 作为起点和终点，以提供符合标准的互操作性。随着比特率的提高，抖动、干扰及其他缺陷的裕量也要加大，因此很难把 BER 控制在 10-12 以下。借助以下工具，您可对设计进行详细地表征和分析。安捷伦――实现您的最佳设计。

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使用 Agilent 86100A 表征高速光发射机一致性测试，AN： 1340-1  
本应用指南重点介绍了三项通信技术所使用的光发射机测试：SONET/SHD、千兆位以太网和光纤通道

应用说明 2000-08-01

PDF PDF 1.96 MB
语言 
Advanced Jitter Generation and Analysis Product Note 
This product note shows how the Agilent pulse generators can be used with the DCA-J Oscilloscope.

应用说明 2004-10-04

PDF PDF 549 KB
Comparison of Different Jitter Analysis Techniques With a Precision Transmitter 
This white paper describes how various jitter analysis techniques give dissimilar results. Which is right? We built a precision jitter transmitter to compare results of different techniques where test sets were exposed to known levels of jitter.

应用说明 2006-04-06

PDF PDF 164 KB
Finding Sources of Jitter with Real-Time Jitter Analysis (AN 1448-2) 
This application note describes how to use a real-time oscilloscope with jitter analysis, along with the stimulus-response techniques, to meet the critical time-correlation requirement to relate jitter trend measurement results to measured signals.

应用说明 2003-06-30

PDF PDF 1.70 MB
语言 
How to characterize the Physical Layer of the Mobile Industry Processor Interface (MIPI D-PHY) 
How to characterize the Physical Layer of the Mobile Industry Processor Interface (MIPI D-PHY)

应用说明 2007-07-30

PDF PDF 611 KB
Improved Method for Characterizing and Modeling Gigabit Flex-Circuit Based Interconnects 
This paper describes sophisticated, time-domain methods of accurately predicting time- and frequency-domain high-speed signal characteristics.

应用说明 2005-09-08

PDF PDF 11.72 MB
Jitter Analysis: The Dual-Dirac Model, RJ/DJ, and Q-Scale 
This paper provides a complete description of the dual-Dirac model, how it is used in technology standards and a summary of how it is applied on different types of test equipment.

应用说明 2005-06-15

PDF PDF 515 KB
Measuring Characteristic Impedance of Short Rambus Motherboard Traces (AN 1304-4) 
This application note tells you how to perform characteristic impedance measurements on Rambus motherboards and SO-RIMM's using TDR with normalization and verification.

应用说明 2000-11-01

PDF PDF 426 KB
语言 
Precision Jitter Analysis Using the Agilent 86100C DCA-J (PN 86100C-1) 
This product note provides a guide to making jitter measurements with the Agilent 86100C DCA-J.

应用说明 2007-03-07

PDF PDF 1.64 MB
语言 
Precision Jitter Transmitter 
This paper introduces a precisely calibrated jitter source capable of applying a wide variety of jitter signals in different combinations at adjustable amplitudes. The system, calibration techniques, and examples are discussed.

应用说明 2005-06-20

PDF PDF 387 KB
Simulation of Jittering Synchronization Signals for Video Interfaces (PN 4) 
This Product Note shows how Research and Development engineers use pulse generators of the Agilent 81100 Family for the development of interfaces ...

应用说明 2006-12-12

PDF PDF 382 KB
Total Jitter Measurements at Low Probability Levels, Using Optimized BERT Scan Method 
This paper describes an optimized technique based on probabliity and statistics theory that enables accurate TJ measurements at the 1e-12 bit error ratio level in about 20 minutes at 10 Gbit/s.

应用说明 2005-07-11

PDF PDF 894 KB
Using Clock Jitter Analysis to Reduce BER in Serial Data Applications 
This Application Note emphasizes on the emerging techniques for reference clock jitter analysis from the perspective of oscillator physics, phase noise theory, and serial data technology.

应用说明 2006-12-01

PDF PDF 1.15 MB
语言