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High-Speed Digital Analysis

Perform detailed characterization with powerful analysis tools

Most serial data links begin and end with high-speed ICs designed for standards-compliant interoperability. As bit rates increase, the margins for jitter, interference and other imperfections make it increasingly difficult to achieve BER of less than 10-12. The following tools will help you characterize and analyze your designs in detail. Agilent - achieve your best design.

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Advanced Jitter Generation and Analysis Product Note 
This product note shows how the Agilent pulse generators can be used with the DCA-J Oscilloscope.

Application Note 2004-10-04

PDF PDF 549 KB
Characterizing High-Speed Optical Transmitters Compliance Testing with the Agilent 86100A AN: 1340-1 
This application note will focus on the testing of opticaltransmitters used by three communications technologies:SONET/SHD, Gigabit Ethernet, and Fibre Channel.

Application Note 2000-08-01

PDF PDF 2.01 MB
Langues 
Comparison of Different Jitter Analysis Techniques With a Precision Transmitter 
This white paper describes how various jitter analysis techniques give dissimilar results. Which is right? We built a precision jitter transmitter to compare results of different techniques where test sets were exposed to known levels of jitter.

Application Note 2006-04-06

PDF PDF 164 KB
Finding Sources of Jitter with Real-Time Jitter Analysis (AN 1448-2) 
This application note describes how to use a real-time oscilloscope with jitter analysis, along with the stimulus-response techniques, to meet the critical time-correlation requirement to relate jitter trend measurement results to measured signals.

Application Note 2003-06-30

PDF PDF 1.70 MB
Langues 
How to characterize the Physical Layer of the Mobile Industry Processor Interface (MIPI D-PHY) 
How to characterize the Physical Layer of the Mobile Industry Processor Interface (MIPI D-PHY)

Application Note 2007-07-30

PDF PDF 611 KB
Improved Method for Characterizing and Modeling Gigabit Flex-Circuit Based Interconnects 
This paper describes sophisticated, time-domain methods of accurately predicting time- and frequency-domain high-speed signal characteristics.

Application Note 2005-09-08

PDF PDF 11.72 MB
Jitter Analysis: The Dual-Dirac Model, RJ/DJ, and Q-Scale 
This paper provides a complete description of the dual-Dirac model, how it is used in technology standards and a summary of how it is applied on different types of test equipment.

Application Note 2005-06-15

PDF PDF 515 KB
Measuring Characteristic Impedance of Short Rambus Motherboard Traces (AN 1304-4) 
This application note tells you how to perform characteristic impedance measurements on Rambus motherboards and SO-RIMM's using TDR with normalization and verification.

Application Note 2000-11-01

PDF PDF 426 KB
Langues 
Precision Jitter Analysis Using the Agilent 86100C DCA-J (PN 86100C-1) 
This product note provides a guide to making jitter measurements with the Agilent 86100C DCA-J.

Application Note 2007-03-07

PDF PDF 1.64 MB
Langues 
Precision Jitter Transmitter 
This paper introduces a precisely calibrated jitter source capable of applying a wide variety of jitter signals in different combinations at adjustable amplitudes. The system, calibration techniques, and examples are discussed.

Application Note 2005-06-20

PDF PDF 387 KB
Simulation of Jittering Synchronization Signals for Video Interfaces (PN 4) 
This Product Note shows how Research and Development engineers use pulse generators of the Agilent 81100 Family for the development of interfaces ...

Application Note 2006-12-12

PDF PDF 382 KB
Total Jitter Measurements at Low Probability Levels, Using Optimized BERT Scan Method 
This paper describes an optimized technique based on probabliity and statistics theory that enables accurate TJ measurements at the 1e-12 bit error ratio level in about 20 minutes at 10 Gbit/s.

Application Note 2005-07-11

PDF PDF 894 KB
Using Clock Jitter Analysis to Reduce BER in Serial Data Applications 
This Application Note emphasizes on the emerging techniques for reference clock jitter analysis from the perspective of oscillator physics, phase noise theory, and serial data technology.

Application Note 2006-12-01

PDF PDF 1.15 MB
Langues