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Designing High Speed Backplanes Utilizing Physical Layer Test System
This Application Note focuses on the problems introduced into the backplane assembly design by the many linear passive components that create reflections due to impedance discontinuities.
應用手冊 2006-01-18 |
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Effective Reflection Characterization for Active Devices Using ENA Option TDR Application Note
This application note describes Hot TDR measurement, which is an effective characterization method for the reflection of transmitter and receiver.
應用手冊 2012-01-12 |
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Limitations and Accuracies of Time and Frequency Domain Analysis of Physical Layer Devices
應用手冊 2005-11-01 |
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2.83 MB
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S-Parameter Techniques for Faster, More Accurate Network Design (AN 95-1)
This Application Note is for information only. Agilent no longer sells or supports these products.
應用手冊 1967-02-01 |
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3.10 MB
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Signal Integrity Analysis Series Part 1: Single-Port TDR, TDR/TDT, & 2-Port TDR
This Application Note focuses on part 1: those which use a single-port TDR, those which use TDR/TDT, and those which use 2-port TDR.
應用手冊 2007-01-01 |
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3.50 MB
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Signal Integrity Analysis Series Part 2: 4-Port TDR/VNA/PLTS
This Application Note focuses on part 2: those which use a 4-port TDR/VNA/PLTS.
應用手冊 2007-02-21 |
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2.75 MB
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Signal Integrity Analysis Series Part 3: The ABCs of De-Embedding
This Application Note focuses on Part 3: The ABCs of De-Embedding explaining different de-embedding techniques & shows how to minimize fixture effects for best results.
應用手冊 2007-07-01 |
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2.44 MB
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