高速數位元件的設計與模擬
安捷倫工具同時支援時域和頻域量測,以便發現潛在問題並確保您完成符合預期的設計。使用安捷倫產品,您可實現最佳的元件設計。
高速數位設計挑戰
- 藉由共同模擬獨立元件,這些元件皆在其最適當的抽象位準上,您可完整分析晶片間連結:通道位準、電路位準或實體位準
- 準確地將背板 S 參數模型導入電路和通道模擬系統,以避免發生因果關係和被動性問題
- 在使用模擬功能在量測平面之間插入數值並擴展至虛擬原型之前,先建立量測資料和模擬資料之間的關聯性。
最新消息
- ClioSoft Announces the Integration of SOS Design Data Management with Advanced Design System
- Agilent Technologies and SiSoft Introduce Pre-Standard IBIS-AMI Modeling Guide
- Agilent Technologies to Demonstrate Newest High-Speed Digital Design and Test Solutions at DesignCon
- Electrical Redriver Modeling Solution to Solve Key Challenges in Designing Chip-to-Chip Links
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Digital and Photonics Webcast Series
Originally broadcast 2010, 2011. Access the recordings of many broadcasts
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Digital Webcast Series - Master the high-speed digital test challenge
multiple broadcasts - refer to www.agilent.com/find/DPTwebcasts for the complete list
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Genesys Webcasts - "How-To-Design" series
Originally broadcast in 2009. Access the 6 WebEX recordings
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Signal Integrity: Include Post-layout PCB Artwork into your Eye Diagram and BER Contour Simulation
Originally broadcast May 5, 2010. Part of the Series: Signal Integrity for High Speed Digital Interconnects.
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Understanding Cross Modulation Effects in a Full Duplex LTE Transceiver
Originally broadcast July 22, 2010
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