Design and Simulation of High-Speed Digital
Agilent tools provide views into the time and frequency domains, revealing the underlying problems and ensuring compliant designs. With Agilent, you'll achieve your best design.
High Speed Digital Design Challenges
- Analyzing complete chip-to-chip links by co-simulating individual components, each at its most appropriate level of abstraction: channel-, circuit- or physical-level
- Importing backplane S-parameter models accurately into circuit and channel simulations, avoiding causality and passivity issues
- Correlating measured and simulated data before using simulation to interpolate between measurement planes and extrapolating to virtual prototypes
새로운 소식
- ClioSoft Announces the Integration of SOS Design Data Management with Advanced Design System
- Agilent Technologies and SiSoft Introduce Pre-Standard IBIS-AMI Modeling Guide
- Agilent Technologies to Demonstrate Newest High-Speed Digital Design and Test Solutions at DesignCon
- Electrical Redriver Modeling Solution to Solve Key Challenges in Designing Chip-to-Chip Links
상세 분류
분야별 검색결과
- 웹캐스트 - recorded (5)
제품 카테고리별
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모든 제품 카테고리
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기타 테스트 및 측정 제품
- 어플리케이션별 테스트 시스템 및 부품 (1)
- 포토닉스 테스트 및 측정 (3)
- GPIB, USB, 랙, 액세서리 (1)
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기타 테스트 및 측정 제품
1-5 / 5
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Digital and Photonics Webcast Series
Originally broadcast 2010, 2011. Access the recordings of many broadcasts
웹캐스트 - recorded |
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Digital Webcast Series - Master the high-speed digital test challenge
multiple broadcasts - refer to www.agilent.com/find/DPTwebcasts for the complete list
웹캐스트 - recorded |
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Genesys Webcasts - "How-To-Design" series
Originally broadcast in 2009. Access the 6 WebEX recordings
웹캐스트 - recorded |
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Signal Integrity: Include Post-layout PCB Artwork into your Eye Diagram and BER Contour Simulation
Originally broadcast May 5, 2010. Part of the Series: Signal Integrity for High Speed Digital Interconnects.
웹캐스트 - recorded |
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Understanding Cross Modulation Effects in a Full Duplex LTE Transceiver
Originally broadcast July 22, 2010
웹캐스트 - recorded |
