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Digital Design & Interconnect Standards

Achieve your best design with Agilent. Investigate specific solutions for high speed standards plus solutions for your high-speed digital design cycle (design, simulation, analysis, debug compliance and signal integrity) challenges.

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- USB (2.0/3.0/Wireless)

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Document Library
- Application Notes
  - Application Note (11)

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- Oscilloscopes, Analyzers, Meters
  - Oscilloscopes (4)
  - Spectrum Analyzers (Signal Analyzers) (3)
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  - Bit Error Ratio Test (BERT) Solutions (2)

1-11 of 11

8 Hints for Debugging and Validating High-speed Buses 8 Hints for Debugging High-speed Buses Application Note 2002-03-05	PDF 2.24 MB
Agilent Method of Implementation (MOI) for USB3.0 Cable-Connector Assembly Compliance Test Agilent Method of Implementation (MOI) for USB3.0 Cable-Connector Assembly Compliance Test Using Agilent E5071C ENA Network Analyzer Option TDR Application Note 2012-12-17	PDF 1.82 MB
Automated USB 2.0 Receiver Compliance Test and Characterization with the Agilent N5990A Automated USB 2.0 Receiver Compliance Test and Characterization with the Agilent N5990A Software Platform: 8 pages Application Note 2007-01-31	PDF 272 KB
Characterization of Balanced Digital Components and Communication Paths Application Note 2001-11-19	PDF 1.01 MB
Crossing the Digital-Analog Divide - White Paper This white paper helps to better understand how to cope with the physical nature of signals that we might prefer to think of as bits, nibbles and bytes, let's start with an ideal digital waveform. Application Note 2012-05-02	PDF 6.46 MB
Debugging USB 2.0: It's Not Just A Digital World (AN 1382-3) Debugging USB 2.0 Systems Application Note 2006-10-05	PDF 392 KB Languages English \| 2006-10-05 \| PDF 392 KB 日本語 \| 2006-04-25 \| PDF 1.12 MB 中文（繁體） \| 2002-12-21 \| PDF 2.60 MB
Solutions for MB-OFDM Ultra-Wideband (UWB) Application Note Application note describes hardware and software for ultra wideband (UWB) testing. Application Note 2008-08-10	PDF 2.63 MB Languages English \| 2008-08-10 \| PDF 2.63 MB 日本語 \| 2006-11-02 \| PDF 2.31 MB
Strategies for Debugging Serial Bus Systems with Infiniium Oscilloscopes This application note discusses the challenges associated with and new solutions for debugging serial bus designs including PCI-Express Generation 1, Inter Integrated Circuit (I2C), Serial Peripheral Interface (SPI), or Universal Serial Bus (USB) Application Note 2009-06-01	PDF 691 KB Languages English \| 2009-06-01 \| PDF 691 KB 中文（简体） \| 2009-06-01 \| PDF 691 KB 日本語 \| 2009-06-12 \| PDF 1.44 MB
USB 2.0 Compliance Testing with Infiniium Oscilloscopes - Application Note This Application Note discusses the Agilent solution for the USB 2.0 test suite. The Agilent solution is the only one-box solution that uses the official USB-IF scripts for precompliance ans compliance testing. Application Note 2013-05-10	PDF 2.02 MB Languages English \| 2013-05-10 \| PDF 2.02 MB 日本語 \| 2010-01-14 \| PDF 3.64 MB
USB 3.0 Protocol Testing with Active Error Insertion Application Note Speed up design and verification of USB designs using the U4612A Jammer Application Note 2012-03-19	PDF 3.51 MB
USB Design and Test - A Better Way Brochure covering Agilent's USB 2.0 and 3.0 test solutions portfolio and applications, discussing measurement challenges and showing how the test solutions and services address these. Application Note 2009-11-03	PDF 821 KB Languages English \| 2009-11-03 \| PDF 821 KB 日本語 \| 2010-02-26 \| PDF 4.56 MB