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ATE Applications

Your test system architecture should give you choices. Its range of possibilities should fit your requirements, preferences and existing test assets ― instrumentation, software and I/O ― now and in the future. That´s the power of Agilent Open, a combination of proven standards and time-saving tools for test automation. From LAN and Web to LXI-based synthetic instruments, our approach to ATE is designed to maximize system longevity and productivity.

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RF Module Test Solution for Speed, Accuracy, and Performance – Auriga Microwave 
RF Module Test Solution for Speed, Accuracy and Performance from Auriga Microwave and Agilent

Brefs de solution 2014-04-09

Aerospace/Defense RF Coaxial Cable Test - Beta LaserMike 
Aerospace/Defense RF Coaxial Cable Test from Beta LaserMike and Agilent.

Brefs de solution 2014-04-09

M9393A PXIe Performance Vector Signal Analyzer - Flyer 
This document provides the features, benefits and performance characteristics for the M9393A PXIe performance vector signal analyzer.

Brochure 2014-02-20

Noise Figure Selection Guide Minimizing the Uncertainties - Selection Guide 
This selection guide, which includes a brief noise figure primer and our current product lineup, and is designed to help you find the best solution for your application.

Guide de sélection 2014-02-14

M9018A PXIe Chassis 18-Slots, 3U, 8GB/s - Data Sheet 
This data sheet describes the capability and advantages of the M9018A PXIe Chassis.

Fiche signalétique 2014-02-11

Phase Noise Measurement Solutions - Selection Guide 
This selection guide will discuss and compare Agilent's most common phase noise measurement techniques -- direct spectrum, phase detector, two-channel cross correlation, including selection tips.

Guide de sélection 2013-07-31

Using RF Recording Techniques to Resolve Interference Problems - Application Note 
This application note looks at functionality that is crucial to today’s commercial wireless and EW applications where interference-related issues are highly problematic.

Notes d’application 2013-03-11

Achieving High-Quality Microwave Measurements with the Right Test Accessories - Application Note 
With high-performance instrumentation and accessories pushing the envelope of advanced high-frequency applications, it is now more crucial than ever for engineers to select the right test accessories.

Notes d’application 2013-03-06

Understanding Phase Noise Needs and Choices in Signal Generation  
This application note reviews the fundamentals of phase noise and takes a closer look at architectural choices and the effects of various functionality alternatives.

Notes d’application 2013-01-14

RF Test Solutions – WinSoft 
Military and Commercial RF Test Solutions from WinSoft and Agilent.

Brefs de solution 2012-05-14

Test Instrument Emulator - WinSoft 
Test Instrument Emulation Solution from WinSoft and Agilent.

Brefs de solution 2012-05-11

COTS-Based Functional ATE – G Systems 
Commercial-off-the-Shelf (COTS) based Automated Functional Test Solutions from G Systems and Agilent.

Brefs de solution 2012-05-10

6 Hints for Enhancing Measurement Integrity in RF/Microwave Test Systems 

Notes d’application 2012-04-30

S-Parameter Measurements on Multiport Devices – In-Phase Technologies 
S-Parameter Measurements on Multiport Devices from In-Phase Technologies and Agilent

Brefs de solution 2012-02-24

Generating and Applying High-Power Output Signals 
This application note describes both the inner workings of the PSG with Option 521 and the applications of its high-power output signals.

Notes d’application 2009-09-30

Using MATLAB to Create Agilent Signal and Spectrum Analyzer Applications 
Learn to use MATLAB software to configure, control, and acquire data from X-Series signal and spectrum analyzers, and then use scripts to create, modify and execute custom analyzer applications.

Notes d’application 2009-09-03

Building Hybrid Test Systems. Ensuring success in two common development scenarios - Application Not 
Application Note 1465-33. When you migrate to a hybrid system that includes LXI along with GPIB, VXI, PXI, or any other architecture, two scenarios are most typical, minimum development time and maximum overall performance

Notes d’application 2008-10-15

Multiport Solutions for E5071C ENA RF Network Analyzers Using External Switches 
This app note describes how to expand the potential of multiport solutions for network analysis using the E5071C, with external electro-mechanical switches on handling high and low power signal measurements.

Notes d’application 2008-03-10

Improving Throughput with Fast RF Signal Generator Switching 
This note describes techniques for optimizing RF signal generators within ATE systems to reduce test times and improve throughput.

Notes d’application 2007-09-19

Modifying a GPIB System to Include LAN/LXI (AN 1465-26)  
This application note takes you through the process of replacing one instrument in a typical GPIB test system and shows how simple changes to the system software make it possible.

Notes d’application 2007-05-10

Using Linux in Your Test Systems: Linux Basics (AN 1465-27) 
If you haven’t used Linux in test applications, this document will provide a detailed overview. Topics include: A brief Linux history, why use Linux, free tools available for application development and an instrument control overview.

Notes d’application 2007-05-08

LXI-compliant oscilloscope boosts efficiency in ATE systems 
The LXI (LAN eXtensions for Instrumentation) standard specifies the interaction of proven, widely used standards to enable fast, efficient, and cost-effective creation and reconfiguration of test systems.

Notes d’application 2007-04-02

Migrating system software from GPIB to LAN/LXI (AN 1465-25) - Application Note 
Migrating system software from GPIB to LAN/LXIis the sixth application note in a series designed to help you manage the shift to LXI from GPIB.

Notes d’application 2007-02-02

Using Synthetic Instruments in Your Test System (AN 1465-24) 
This note represents a brief history of SI, compares a rack-and-stack system to an SI-based system, descibes the initial applications of SIs, and illustrates the emulation of conventional instruments with SIs.

Notes d’application 2006-08-28

How to Use VXI and PXI in Your New LXI Test System (AN 1465-23) 

Notes d’application 2006-06-06

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