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DDR Memory Design & Test

Double Data Rate (DDR) Synchronous Dynamic Random Access Memory (SDRAM) is implemented in several forms today – the original DDR (also called DDR1), DDR2 which improved performance and lowered power consumption, DDR3 with even better performance, and low-power DDR (LPDDR), that is targeted for mobile devices.

Agilent is an active member of JEDEC, with consistent participation in workshops and specification issues. These resources you find here will provide you with an overview of DDR design, understand the latest measurement techniques, and illustrate design and debug approaches.

Use the matrix below to discover specific solutions for your DDR needs.

  Simulation Functional Test (Oscilloscope) Validation (Logic Analyzers Probing Solutions
DDR2 Learn more Learn more Learn more Learn more
DDR3 Learn more Learn more Learn more Learn more
DDR4 Planned Learn more Learn more  
LPDDR2 Learn more Learn more Learn more  
LPDDR3 Planned Learn more Learn more  
GDDRS Planned Learn more    

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정렬방식:
텔레콤, 기업 및 디지털 설계를 위한 지터 솔루션  
고속 디지털 전송 시스템, 고속 I/O 연결 및 버스에서 지터의 특성분석 및 테스트를 위한 완전한 솔루션입니다.

브로셔 2005-08-26

PDF PDF 1.38 MB
DDR Memory Design and Test Overview  
Brief overview of Agilent solutions for DDR design and test.

브로셔 2012-12-19

PDF PDF 1.14 MB
DDR Memory Design and Test – A Better Way 
Agilent offers the complete solutions for all areas of DDR design, meeting your needs for electrical physical layer, protocol layer, and functional test.

브로셔 2012-12-19

PDF PDF 5.17 MB