高速数字
在您的成功之路上,每一代数字标准的更改都带来新的风险。创建新产品并与像您这样的工程师协同工作时,我们对此深有体会。安捷伦用于进行高速数字测试的解决方案集是仪表和广泛专业技术(建立在我们不断与业界专家进行沟通交流的基础之上)的结合。通过分享我们最新的经验,安捷伦能够帮助您预测挑战和提高创建值得骄傲的产品的能力。安捷伦――实现您的最佳设计。
浏览完整的设计周期
通过浏览本网站,您将能了解到分别适用于设计周期全部四个阶段以及信号完整性分析核心部分的解决方案。
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Agilent EEsof EDA 客户支持手册
手册 2005-02-01 |
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Agilent EEsof EDA 最佳通信设计软件
Agilent EEsof EDA premier communications design software product overview brochure.
手册 2011-08-03 |
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串行 ATA 设计和测试 - 最佳方法
Agilent's SATA test solutions portfolio and applications, discussing measurement challenges and showing how the test solutions and services address these.
手册 2009-12-08 |
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使用先进设计系统进行高速数字设计
This brochure describes 3 ADS suites of applicable simulators, libraries, and capabilities for signal integrity engineers.
手册 2011-09-06 |
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查明、优化、交付。克服千兆位数字设计的挑战
Brochure shows Agilent’s high-speed digital solution set , a range of essential tools, measurement and simulation—that will help cut through the challenges of gigabit digital designs.
手册 2011-08-25 |
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适用于电信、企业和数字设计的抖动解决方案
Complete solutions for characterization and test of jitter in high-speed digital transmission systems, high-speed I/O connections, and buses.
手册 2008-06-25 |
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ADS W2302EP/ET, W2500EP/ET, and W2312EP/ET Transient Convolution Products
Advanced Design System W2302EP/ET Transient Convolution Element, W2500EP/ETTransient Convolution GT Option, and W2312EP/ET Transient Convolution Distributed Computing 8-pack
手册 2012-10-30 |
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Agilent E2960B Series for PCI Express 1.0 & 2.0
Providing customers with the fastest time to insight with an integrated suite of analyzer and exerciser tools.
手册 2007-05-15 |
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Agilent EEsof EDA Customer Support Brochure
手册 2005-02-01 |
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Agilent EEsof EDA Premier Communications Design Software
Agilent EEsof EDA premier communications design software product overview brochure.
手册 2011-08-03 |
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Complete solutions for characterization, debug, compliance test of HDMI designs
This brochure discusses test solutions for HDMI. Thorough characterization and validation of HDMI-based designs
手册 2007-10-19 |
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DDR Memory Design and Test Overview
Brief overview of Agilent solutions for DDR design and test.
手册 2012-12-19 |
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DDR Memory Design and Test – A Better Way
Agilent offers the complete solutions for all areas of DDR design, meeting your needs for electrical physical layer, protocol layer, and functional test.
手册 2012-12-19 |
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Download the Technical Information Package for W1714 AMI Modeling Kit
Generate ANSI/EIA-656 IBIS AMI compliant models for your SERDES chip
促销资料 2010-05-20 |
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EDA Support Services
Agilent Support Services for EDA Products offers customers several benefits otherwise not available. This service is designed to help you get the most out of your software purchases.
手册 2013-04-09 |
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HDMI and DisplayPort Design and Test - A Better Way Brochure
Brochure covering Agilent's HDMI and Displayport test solutions portfolio and applications, discussing measurement challenges and showing how the test solutions and services address these.
手册 2010-05-20 |
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High Speed Digital Design with Advanced Design System
This brochure describes 3 ADS suites of applicable simulators, libraries, and capabilities for signal integrity engineers.
手册 2012-11-02 |
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Jitter Solutions for Telecom, Enterprise, and Digital Designs
Complete solutions for characterization and test of jitter in high-speed digital transmission systems, high-speed I/O connections, and buses.
手册 2008-06-25 |
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Mastering Jitter in Serial Gigabit Designs
Mastering Jitter in Serial Gigabit Designs
促销资料 2006-06-22 |
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PCI Express Design and Test - From Electrical to Protocol
Agilent's PCI EXPRESS® brochure will explain basic differences between Gen1, Gen2, and Gen3 as well as the full breadth of Agilent's PCIe solutions.
手册 2012-01-17 |
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PCI Express Tools
手册 2006-10-02 |
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Pinpoint. Optimize. Deliver. Cut through the challenges of gigabit digital designs
Brochure shows Agilent’s high-speed digital solution set , a range of essential tools, measurement and simulation—that will help cut through the challenges of gigabit digital designs.
手册 2011-08-25 |
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Serial ATA Design and Test - A better way
Agilent's SATA test solutions portfolio and applications, discussing measurement challenges and showing how the test solutions and services address these.
手册 2009-12-08 |
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The Power of S-Parameters for High Speed Digital Design Tutorial
Learn to use S-parameters for high-speed digital designs with this video tutorial.
促销资料 2012-09-07 |
