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DDR Memory Design & Test

Double Data Rate (DDR) Synchronous Dynamic Random Access Memory (SDRAM) is implemented in several forms today – the original DDR (also called DDR1), DDR2 which improved performance and lowered power consumption, DDR3 with even better performance, and low-power DDR (LPDDR), that is targeted for mobile devices.

Agilent is an active member of JEDEC, with consistent participation in workshops and specification issues. These resources you find here will provide you with an overview of DDR design, understand the latest measurement techniques, and illustrate design and debug approaches.

Use the matrix below to discover specific solutions for your DDR needs.

  Simulation Functional Test (Oscilloscope) Validation (Logic Analyzers Probing Solutions
DDR2 Learn more Learn more Learn more Learn more
DDR3 Learn more Learn more Learn more Learn more
DDR4 Planned Learn more Learn more  
LPDDR2 Learn more Learn more Learn more  
LPDDR3 Planned Learn more Learn more  
GDDRS Planned Learn more    

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Tips for Making Better Memory Measurements – Video Series 
Videos that show customers how perform a comprehensive, unique and extensive analysis in less time.

기본 데모 2013-03-18

 
DDR 1, 2 and 3 solutions Video 
Includes probing methods, read/write separation technique and automated JEDEC compliance measurements with Infiniium Series oscilloscopes.

기본 데모 2007-12-27

WMF WMF 52.75 KB
Probe loading 
Probe loading

기본 데모 2005-12-22

WMF WMF 19.66 MB
Flexibility of Agilent's InfiniiMax Probe System 
This 10-minute video provides some very practical

제품 둘러보기 2004-11-22

WMF WMF 20.29 MB