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何謂 Agilent Medalist i3070 有限存取測試解決方案? 
傳統的內電路測試(ICT)技術假設您可以任意地存取印刷電路板上的測試節點,以便進行電氣測試。事實上...

FAQ 2012-02-01

 
What is a Bypass Instruction? 
The Bypass Instruction is an IEEE 1149.1 mandatory instruction which select the single bit Bypass register between the TDI and TDO.

FAQ 2012-02-01

 
What is a linkage bit in a BSDL? 
The linkage bit in a Boundary Scan Description Language (BSDL) is use to describe a nondigital pins such as power, ground, no-connects, or analog signals in a boundary scan device.

FAQ 2012-01-01

 
What is a BSDL logical port? 
The Boundary Scan Description Language (BSDL) logical port description is used to assign names and connections on the device pin.

FAQ 2012-01-01

 
What is a boundary scan linker mux? 
A boundary scan linker mux (multiplexer) device, also known as JTAG scan bridge or scan path linker.

FAQ 2011-12-01

 
Is it possible to test non-boundary scan digital devices connected to boundary scan devices? 
This test strategy is commonly known as Silicon Nail test where the boundary scan cell (driver/receiver) of the boundary scan device connected to the non boundary scan device pins will be able to simulate the operation of the non-boundary scan device.

FAQ 2011-12-01

 
What is a compliance enable pin? 
Compliance enable pins must be held with stable logic states as described in the boundary scan description language (BSDL) before the device can be engaged in any 1149.1 boundary scan activities.

FAQ 2011-11-01

 
What is a USERCODE instruction? 
The USERCODE is an optional instruction in the boundary scan description language) (BSDL) that allows a 32-bit user programmable identification code to be loaded and shifted out for examination.

FAQ 2011-11-01

 
What is “Device Identification Register”? 
Use of the optional device identification register allows a data to be serially read from the device.

FAQ 2011-09-27

 
What is a boundary scan chain? 
A boundary scan chain consists of two or more boundary scan devices

FAQ 2011-08-29

 
What is the Max DC Input Voltage Before the Battery Charger Shuts Down? 
21-22 Volts.

FAQ 2011-08-29

 
What is a silicon nail test on Agilent Medalist i3070? 
The silicon nail test refers to the use of boundary register cells to replace the needs for physical probes on nodes during in circuit testing of non boundary scan device.

FAQ 2011-07-29

 
What is a CPLD ISP? 
The Agilent Medalist ICT system can be used to program IEEE 1149.1 compliant CPLD using the test access port (TAP). This programming becomes part of the overall testplan and is executed during in circuit test (ICT).

FAQ 2011-07-29

 
What is a Boundary Register? 
The Boundary Register is the most important part of the boundary scan, it is a shift-register-based structure which has one or more boundary scan cell connected to a device pin.

FAQ 2011-06-23

 
What is the IEEE 1149.6 Standard? 
IEEE Standard 1149.6 refer to the “Boundary scan testing of Advanced Digital Networks” but is more popularly known as Dot6 or AC extest standard.

FAQ 2011-06-23

 
What is the IEEE 1532 Standard? 
The IEEE Standard 1532-2002 is a standard for in-system configuration of programmable components such as complex programmable logic device (CPLD), erasable programmable logic device (EPLD), and field programmable gate arrays (FPGA).

FAQ 2011-06-01

 
Is IEEE 1532 Standard supported on Agilent Medalist i3070? 
The IEEE 1532 Boundary-Scan Description Language (BSDL) can be compiled on the Agilent Medalist i3070 but it will not generate a specific IEEE 1532 test to run on the Agilent Medalist i3070.

FAQ 2011-06-01

 
What are the Data Register in a Boundary Scan? 
What are the Data Register in a Boundary Scan?

FAQ 2011-05-04

 
What is a Boundary Scan TAP Controller? 
A TAP controller is a 16-state machine, programmed by the Test Mode Select (TMS) and Test Clock (TCK) inputs, which controls the flow of data bits to the Instruction Register (IR) and the Data Registers (DR). The TAP Controller can be thought of as the control center of a boundary-scan device.

FAQ 2011-05-03

 
What is Boundary scan? 
Boundary-Scan is a test technique that involves devices designed with shift registers placed between each device pin and the internal logic

FAQ 2011-03-29

 
What is an Instruction Register? 
The Instruction Register lets you define the test to be performed, or the test data register to be accessed, or both during boundary scan test. Each Instruction Register cell comprises a shift-register flip-flop and a parallel output latch.

FAQ 2011-03-29

 
Agilent i3070是否可對自我監測單元自動執行邊界掃描測試? 
Agilent i3070是否可對自我監測單元自動執行邊界掃描測試?

FAQ 2011-03-02

 
What are the IEEE 1149.6 Boundary Scan tests generated on the Agilent Medalist i3070 in-circuit tester?  
The following IEEE 1149.6 Boundary Scan tests are generated on the Medalist i3070 in-circuit tester:

FAQ 2011-02-25

 
What are the IEEE standards related to Boundary Scan? 
The following IEEE standards are related to boundary scan testing:

FAQ 2011-02-25

 
為什麼要使用邊界掃描自我監測單元? 
使用自我監測單元是非常重要的考量。

FAQ 2011-02-05

 

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