Integrating 설계 및 테스트
Connected Solutions refers to the integration of Agilent's Advanced Design System (ADS) EDA Software and Agilent instrumentation into a solution that enables design and verification capabilities.
It combines simulation and measurement, and allows the sharing of signals, measurements, algorithms, and data in both directions between the two domains.
Connected Solutions make it possible to:
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Create simulation models from measurements.
Connected Solutions can be used to measure existing components and create simulation models. These models can then be used in ADS to determine how the existing hardware might impact the overall performance of a system or circuit in simulation, saving design time and money. -
Accelerate verification testing.
Connected solutions make it easy to determine if a component or sub-system will work within the system as a whole, without having to build the whole system. Integration issues can be found and fixed earlier in the design process, reducing risk and saving design re-work time and costs. -
Extend the capability and value of instruments.
Connected Solutions make applications such as coded Bit Error Rate (BER) testing of a component or stimulating a device with the impaired signal that will be present in a system possible, enhancing the value of Agilent's test instrumentation.
Learn more about ADS-Instrument Links
상세분류 제거1-16 / 16
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Article: COTS Gear Generates Multi-Emitter Test Signals
This article discusses COTS test hardware and software being used to create multi-emitter test signals using ESL design simulation software and wideband AWGs
기사 2012-09-27 |
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Design, simulation and measurement automation
Link to Electronic Products and Technology article discussing the marrying of both electronic design automation (EDA) tools and processes with measurement for system level design and verification.
기사 2012-08-10 |
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Testing Radar and EW Systems for the Real-World
The solutions described in this Microwave Journal article do more than address a wide range of present and future radar systems: They also help overcome organizational hurdles.
기사 2012-07-12 |
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Tackling MIMO Design and Test Challenges for 802.11ac WLAN
This article from Microwave Journal shows how the system engineer can use system simulation to help understand the design performance and design requirements needed to achieve transmitter system-level metrics such as EVM.
기사 2012-03-11 |
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Using Software Defined Instruments to Address the Mixed-Signal Test Challenges of Today’s Software
Link to a NASA Tech Brief article which states to ensure successful operation of SDR designs requires use of modern instruments capable of bridging the digital-analog divide, while also addressing any challenges stemming from use of the SDR technology itself
기사 2012-02-01 |
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Using SystemVue to Overcome 4G Challenges
EE Times design article (Part 2) on using SystemVue to overcome 4G challenges.
저널 2011-12-04 |
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Integrated Solutions for Testing Wireless Communication Systems
IEEE Communications Magazine, Topics in Radio Communications article on SystemVue test solutions, June 2011.
기사 2011-06-02 |
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1.04 MB
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The Coming of Age of the Software Communications Architecture
Microwave Jounral article reprint on Software Defined Radio (SDR) technology, development tools for complex waveforms and radio applications in aerospace/defense and commercial applications.
기사 2011-04-24 |
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1.61 MB
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Multichannel scopes enable MIMO RF testing
This article discusses troubleshooting techniques with time-coherent multichannel scopes and 89600 VSA software to gain insight into error mechanisms affecting their hardware EVM performance and system-level RF transmitter performance budgets.
기사 2011-04-12 |
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Tackling the Mixed-signal Testing Challenges of SDR
Software-defined radios (SDR) utilize a combination of FPGAs, DSPs and analog/RF designs to achieve the radio’s system performance.
기사 2011-03-09 |
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Defining a New Methodology for Radar System Design
Article from Microwave Product Digest, October 2010, discussing the use of analysis suites for the design of advanced digital signal processing techniques.
특집 기사 2010-10-01 |
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Mindspeed Technologies, Inc. "LTE and WiMAX™ Layer 1 Compliance using SystemVue"
Mindspeed, a leading IC provider to the wireless communications infrastructure market, uses Agilent SystemVue to bring measurement-grade verification inside the baseband design process.
사례연구 2010-04-14 |
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44 KB
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Microwave Journal Cover Article: X-parameters Fundamentally Changing Nonlinear Microwave Design
Provides an overview of the invention and need for x-parameters to model the behavior of non-linear devices. This is an article reprint from Microwave Journal, Issue March 2010, Vol.53. No.3
기사 2010-03-25 |
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771 KB
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1-GHz Digital Channel Multiplexer for Satellite Outdoor Unit Based on a 65-nm CMOS Transceiver
STMicroelectronics needed to rapidly evaluate and prototype real-world effects on a high-performance wideband PHY architecture for satellite communications and used Agilent SystemVue from Agilent EEsof EDA.
사례연구 2009-11-17 |
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116 KB
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Using a design-to-test capability for LTE MIMO
Article written for RF DesignLine by Agilent experts explains how system-level simulation helps engineers gain valuable insight into design sensitivities of LTE MIMO systems.
사례연구 2009-07-10 |
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Flexible Software-Defined Test Instruments
This Article by Greg Jue presents the next generation of software defined test instruments; a key element in cost control, time to market, design flexibility and standards evolution.
기사 2006-11-01 |
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1.95 MB
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