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Boundary-Scan Advanced Diagnostic Methods This paper illustrates how usage of boundary scan circuit information and predictive analysis of potential assembly faults will provide more precise and accurate diagnostic information. 專文 2012-04-17	PDF 1.20 MB
Comparing Boundary Scan Methods White Paper The need for reusable tests is driving standalone boundary scan-ICT integration. This article first appeared in the September 2009 issue of Circuits Assembly and is reprinted with kind permission. 專文 2010-06-09	PDF 2.68 MB
Limited Access Tools Improve Test Coverage Smaller test pads and shrinking board sizes are posing new challenges, and driving innovations to overcome limited access with new test solutions. Agilent Boundary Scan, 1149.6, 1149.1, bead probes, cover-extend 專文 2010-10-20	PDF 275 KB
Principal Component Analysis-Based Compensation for Measurement Errors This paper examines some issues and trends that justify adding features to IEEE 1149.1 that will facilitate safe, fast and effective initialization of a board or system, to get it ready for testing. Published with kind permission of the IEEE 專文 2010-12-10	PDF 1.10 MB
Solutions for Undetected Shorts on IEEE 1149.1 Self-Monitoring Pins This paper presents the problem of undetected shorts on IEEE 1149.1 compliant self-monitoring pins, and potential mitigating solutions. 專文 2010-12-10	PDF 789 KB
Surviving State Disruptions Caused by Test: the "Lobotomy Problem" This paper examines some issues and trends that justify adding features to IEEE 1149.1 that will facilitate safe, fast and effective initialization of a board or system, to get it ready for testing. Published with kind permission of the IEEE 專文 2010-12-10	PDF 402 KB
Testing DDR Memory; How On-Chip DFT Helps This paper discusses DDR memory testing challenges we see today, and how the adoption of DFT capabilities pays off in higher test coverage, better diagnostics and reduced programming/support time. 專文 2012-04-17	PDF 530 KB
The Proposed IEEE Test Standards There is a resurgence of interest in Boundary Scan and Built in Self Test (BIST) initiatives to be part of IEEE standards. This article explains the IEEE standard and their benefits to the industry. Agilent Boundary Scan, 1149.6, 1149.1, bead probes, cover-extend 專文 2010-10-20	PDF 2.83 MB