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Premier Si/III-V Device Modeling and Characterization Solutions

Agilent provides premier solutions for characterization and modeling of cutting-edge CMOS and compound semiconductor devices. Agilent is the only vendor that provides complete end-to-end modeling solutions, from automated measurements, accurate device model extraction, comprehensive qualification to final process design kit (PDK) validation. Comprehensive modeling services are offered, supported by Agilent’s expert engineers and advanced labs. Some of our key device modeling and characterization EDA software solutions include:

  • IC-CAP: Most powerful III-V/RF modeling platform
  • IC-CAP WaferPro: Fast and accurate automated measurement platform
  • Model Builder Program (MBP): Complete Silicon turnkey device modeling platform
  • Model Quality Assurance (MQA): Industry standard SPICE model signoff and acceptance platform

Device modeling and characterization challenges

  • As device geometries get smaller, the need to use accurate models and to control statistical variations in device processing performance becomes ever more important
  • Circuit designers need models that can accurately predict DC behaviors, as well as RF and noise behaviors
  • Different process technologies require a variety of models that can be quickly adapted to the unique processes
  • With modeling measurements taking hours or even days, measurement control software must also work with probers and instruments to allow automated measurements across temperature

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Agilent EEsof EDA Newsletter - Product and Application News 
Keep tabs on the latest product and application news and review the archives of the Agilent EEsof EDA Newsletter.

Newsletter 2013-05-14

 
Agilent embraces GaN modeling in IC-CAP upgrade 
EETimes Design Article highlights new capabilities in IC-CAP 2013.01.

Article 2013-01-09

 
Follow Agilent EEsof EDA on Twitter! 
Twitter enables you to keep current on news and updates with Agilent EEsof through the exchange of quick, frequent answers to one simple question: What are you doing?

Newsletter 2010-03-04

 
Future Device Modeling Trends 
Modeling the nonlinear device (basic nonlinear component) for circuit and system simulation downstream.

Article 2012-11-28

PDF PDF 6.08 MB
Link Measurements to Nonlinear Bipolar Device Modeling 
This Article explains that the dynamic thermal bipolar model can be developed through evaluation of device thermal resistance and capacitance.

Article 1996-02-01

PDF PDF 1.58 MB
Overview: Applying Nonlinear RF Device Modeling to Verify S-Parameter Linearity 
This Article is intended to explain the basics of “what’s behind S-parameters” from a modeling engineer's standpoint & on how to apply Harmonic Balance simulators to check the validity of device models.

Article 2001-09-01

PDF PDF 460 KB
RF Device Modeling for Successful High-Frequency Design Challenges 
This Article by Joe Civello focuses on challenges associated with creating accurate high-frequency device models; proposes a process for extracting accurate models necessary for successful HF design.

Article 2004-01-01

PDF PDF 2.26 MB