Digital Design & Interconnect Standards
Achieve your best design with Agilent. Investigate specific solutions for high speed standards plus solutions for your high-speed digital design cycle (design, simulation, analysis, debug compliance and signal integrity) challenges.
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Agilent EEsof EDA Newsletter - Product and Application News
Keep tabs on the latest product and application news and review the archives of the Agilent EEsof EDA Newsletter.
Bulletin d'information 2013-05-14 |
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Exploring The Test Requirements For DisplayPort Receivers
Exploring The Test Requirements For DisplayPort Receivers
Article 2008-01-28 |
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Follow Agilent EEsof EDA on Twitter!
Twitter enables you to keep current on news and updates with Agilent EEsof through the exchange of quick, frequent answers to one simple question: What are you doing?
Bulletin d'information 2010-03-04 |
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Inphi Delivers Memory Interface Chip for DDR3-1600 Using Advanced Design System
This Success Story details how Inphi delivered memory interface chip for DDR3-1600 using Agilent’s Advance Design System (ADS).
Étude de cas 2009-03-12 |
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Partner article using ADS: Practical Fiber Weave Effect Modeling -- Lamsim Enterprises, Inc.
Partner article using ADS: Practical Fiber Weave Effect Modeling -- Lamsim Enterprises, Inc.
Article 2011-01-11 |
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Practical Analysis of Backplane Vias - White Paper
This paper describes the methodology of using measurements on a test vehicle to build a high bandwidth, scalable model of long vias which includes the through and stub effects which can be used for system simulation.
Étude de cas 2009-04-20 |
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S-parameters Without Tears
This article explains s-parameter theory and shows how to create accurate, delay-causal, and passive time-domain models by combining band-limited s-parameter data with knowledge about the physical characteristics of a component.
Journal 2010-01-25 |
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Signal Integrity Analysis and Simulation Tools include IBIS Models
This Article describes the types of models that need to be taken together for high-speed signal integrity analysis, and illustrates their use in a simulation of a high-speed memory circuit.
Article 2004-09-01 |
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Signal Integrity Simulation of PCI Express Gen 2 Channel
Article reprint from XrossTalk Magazine, Janurary 2009, author Jason Boh.
Article 2009-03-23 |
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Swimming in the channel
Signal-integrity problems can come back to bite you if you're not careful. Specialized software keeps the sharks away. Link to EDN magazine 3/18/2010 to read an article by their Technical Editor.
Article 2010-03-18 |
