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RF & Microwave

For most of your RF & Microwave measurement needs, you can find application & solution information here.

Be sure to check the library of application notes for detailed information on using your equipment and successfully completing the measurements you need.

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Enabling Fast Characterization of PA Performance with Modulated Signals 
Microwave Product Digest (MPD) featured article written by Agilent Technologies' Andy Howard.

Journal 2012-10-15

 
Enabling Simulation and Test of Custom OFDM Signals 
Orthogonal frequency division multiplexing (OFDM) has become attractive for many current and emerging commercial applications because it provides a combination of data throughput, scalability, and robustness.

Article 2013-04-01

 
Envelope Transient Analysis: Successful Wireless Systems and IC Designs 
This Article highlights the Envelope Transient Analysis required for Wireless Systems and IC Designs by Dr. Alex Passinsky and Dr. Vladimir Veremey (Xpedion Design Systems, Inc.).

Article 2000-02-22

PDF PDF 752 KB
ESL Design Notebook Blog 
The blog home of Electronic System-Level Design at Agilent highlighting applications, news, and opinions from a cross-discipline, system-level approach to design and verification in communications and defense.

Journal 2013-04-02

 
Fast Multitone Analysis of RF Transceivers 
This Article written by George Estep, Pete Johnson and Vladimir Veremey describes Fast Multitone analysis of RF Transceivers in detail.

Article 2009-03-24

PDF PDF 1.74 MB
Flexible Software-Defined Test Instruments 
This Article by Greg Jue presents the next generation of software defined test instruments; a key element in cost control, time to market, design flexibility and standards evolution.

Article 2006-11-01

PDF PDF 1.95 MB
Follow Agilent EEsof EDA on Twitter! 
Twitter enables you to keep current on news and updates with Agilent EEsof through the exchange of quick, frequent answers to one simple question: What are you doing?

Newsletter 2010-03-04

 
How to Build EM-Accurate Parameterized Passive Models? 
An Article by Mounir Adada (Agilent Technology) highlights how modern EM parametric modeling tools can contribute in getting the products out the door right the first time.

Article 2002-05-30

PDF PDF 165 KB
How to design a high-performance scope: One team’s approach 
EE Times Design Article on how an Agilent Technologies design team discovers some valuable lessons that could prove useful for any designer or design team looking for success on their next project.

Article 2012-06-07

 
Inphi Delivers Memory Interface Chip for DDR3-1600 Using Advanced Design System 
This Success Story details how Inphi delivered memory interface chip for DDR3-1600 using Agilent’s Advance Design System (ADS).

Case Study 2009-03-12

PDF PDF 196 KB
Integrated Solutions for Testing Wireless Communication Systems 
IEEE Communications Magazine, Topics in Radio Communications article on SystemVue test solutions, June 2011.

Article 2011-06-02

PDF PDF 1.04 MB
Linearizing PAs using Digital Predistortion, EDA Tools and Test Hardware 
This Article describes the process for developing and implementing an effective power amplifier linearization scheme using baseband adaptive digital pre-distortion.

Article 2004-04-01

PDF PDF 490 KB
LTE Layer 1 Verification using SystemVue, Xilinx/SystemVue Case Study 
Xilinx, a leading FPGA provider for wireless communications, uses Agilent SystemVue to bring measurement-grade verification to the inside of the baseband design process

Case Study 2010-02-02

PDF PDF 104 KB
Microwave Journal Cover Article: X-parameters Fundamentally Changing Nonlinear Microwave Design 
Provides an overview of the invention and need for x-parameters to model the behavior of non-linear devices. This is an article reprint from Microwave Journal, Issue March 2010, Vol.53. No.3

Article 2010-03-25

PDF PDF 771 KB
Mindspeed Technologies, Inc. "LTE and WiMAX™ Layer 1 Compliance using SystemVue" 
Mindspeed, a leading IC provider to the wireless communications infrastructure market, uses Agilent SystemVue to bring measurement-grade verification inside the baseband design process.

Case Study 2010-04-14

PDF PDF 44 KB
MMIC Design: Speed to Market with the Lowest Cost and Highest Yield 
This Article by Jack Sifri (Agilent Tech.) brings out the five important steps that are key elements of a successful MMIC Design process, in order to satisfy the speed to market at the lowest cost.

Article 2008-05-15

PDF PDF 1.58 MB
Multichannel scopes enable MIMO RF testing 
This article discusses troubleshooting techniques with time-coherent multichannel scopes and 89600 VSA software to gain insight into error mechanisms affecting their hardware EVM performance and system-level RF transmitter performance budgets.

Article 2011-04-12

 
New LDMOS Model Delivers Powerful Transistor Library - Part 1 
This Article presents a new CMC LDMOS model that can accurately predicts both small-signal and nonlinear performance, and is scalable for devices of different sizes and power output capabilities.

Article 2004-10-01

PDF PDF 530 KB
New LDMOS Model Delivers Powerful Transistor Library - Part 2 
This Article presents that the CMC (LDMOS FET) model can be scaled for a larger device, with a good fit for signal, power and distortion performance as illustrated by a 60W Doherty PA design example.

Article 2004-11-01

PDF PDF 684 KB
Overview: Applying Nonlinear RF Device Modeling to Verify S-Parameter Linearity 
This Article is intended to explain the basics of “what’s behind S-parameters” from a modeling engineer's standpoint & on how to apply Harmonic Balance simulators to check the validity of device models.

Article 2001-09-01

PDF PDF 460 KB
Power Amplifier Design Speed-Up Techniques 
This Article presents how to speed up Power Amplifier Design by fast source-pull, real-time load-pull and accurate measurement-based behavioural models.

Article 2005-11-01

PDF PDF 1.71 MB
Product How To: Design a polar frequency discriminator 
Polar frequency discriminators (PFD) are widely used in radar and direction-finding applications to determine the unknown frequency of incoming pulses. This article explains how to design the RF portion of a PFD, over a frequency range of 2 to 8 GHz, using Agilent’s ADS software.

Article 2012-06-08

 
RF SiP Design Verification Flow with Quadruple LO Down Converter SiP  
This Article by HeeSoo Lee and Dean Nicholson outlines the design flow used for a System-in-Package component, using multiple die integrated into a single packaged device.

Article 2007-05-01

PDF PDF 490 KB
Solving the RFIC Design for Yield and Verification Dilemma 
Microave Journal article on the role and evolution of simulation-based performance verification and yield for today’s highly integrated RFICs for digital wireless communications.

Journal 2010-07-15

 
Sorting Through EM Simulators 
Matching an electromagnetic simulator to a particular application requires an understanding of the different simulation technologies at the heart of these software tools.

Article 2012-05-25

PDF PDF 3.50 MB

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