DDR Memory Design & Test
Double Data Rate (DDR) Synchronous Dynamic Random Access Memory (SDRAM) is implemented in several forms today – the original DDR (also called DDR1), DDR2 which improved performance and lowered power consumption, DDR3 with even better performance, and low-power DDR (LPDDR), that is targeted for mobile devices.
Agilent is an active member of JEDEC, with consistent participation in workshops and specification issues. These resources you find here will provide you with an overview of DDR design, understand the latest measurement techniques, and illustrate design and debug approaches.
Use the matrix below to discover specific solutions for your DDR needs.
| Simulation | Functional Test (Oscilloscope) | Validation (Logic Analyzers | Probing Solutions | |
|---|---|---|---|---|
| DDR2 | Learn more | Learn more | Learn more | Learn more |
| DDR3 | Learn more | Learn more | Learn more | Learn more |
| DDR4 | Planned | Learn more | Learn more | |
| LPDDR2 | Learn more | Learn more | Learn more | |
| LPDDR3 | Planned | Learn more | Learn more | |
| GDDRS | Planned | Learn more |
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Agilent Technologies Introduces Industry's Fastest Logic Analyzer
New Instrument Offers Reliable Data Capture Rates up to 4 Gb/s on Industry's Smallest Eye Openings
보도자료 2011-03-28 |
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Agilent Technologies Introduces Industry-First, Most Comprehensive DDR3 Test Suite
보도자료 2009-04-30 |
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Agilent Technologies to Participate as Sole Test, Measurement Expert at JEDEC Flash Storage Summits
보도자료 2009-04-30 |
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Industry's First DDR2, DDR3 BGA Probe Solution for Oscilloscopes, Logic Analyzers
Industry's First DDR2, DDR3 BGA Probe Solution for Oscilloscopes, Logic Analyzers
보도자료 2008-01-30 |
