Digital Design & Interconnect Standards
Achieve your best design with Agilent. Investigate specific solutions for high speed standards plus solutions for your high-speed digital design cycle (design, simulation, analysis, debug compliance and signal integrity) challenges.
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- High-Speed Digital (24)
- DDR Memory (4)
- DisplayPort (5)
- HDMI (6)
- PCI Express® (6)
- Serial ATA (SATA) (6)
- Serial Attached SCSI (SAS) (2)
- USB (2.0/3.0/Wireless) (4)
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- Communiqués de presse
- Dossier de presse (57)
- Communiqués de presse
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1-25 sur 57
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Agilent Introduces PI Solution to Solve Key Challenge in Designing Power Distribution Networks
A power integrity solution to quickly and accurately solve the perforated-plane power integrity challenge
Dossier de presse 2011-02-01 |
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Agilent Ships Latest Advanced Design System Platform for RF and Microwave Design and Simulation
Agilent announces shipment of the latest release of its flagship RF and microwave design and simulation platform, Advanced Design System 2011.
Dossier de presse 2011-03-30 |
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Agilent Technologies and Fujitsu Microelectronics Pacific Asia Ltd. to Deliver Chipset Test Solution
Dossier de presse 2007-10-24 |
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Agilent Technologies and SiSoft Introduce Pre-Standard IBIS-AMI Modeling Guide
Agilent and Signal Integrity Software, Inc. (SiSoft) announce guidelines that enable system designers to use advanced jitter and broadband analog capabilities when modeling high-speed serial devices.
Dossier de presse 2013-01-29 |
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Agilent Technologies Announce USB 3.0
Dossier de presse 2009-11-18 |
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Agilent Technologies Announces YouTube Channel for Agilent EEsof EDA
Channel Features More than 100 Videos with Subtitles in 50 Languages.
Dossier de presse 2010-01-19 |
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Agilent Technologies Broadens SAS, SATA Test Portfolio through Partnership with SerialTek
Dossier de presse 2009-09-09 |
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Agilent Technologies Chosen by Allion Test Labs to Test Digital Display Technologies
Dossier de presse 2007-12-05 |
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Agilent Technologies Commits $90 Million Gift of Software to Georgia Institute of Technology
Agilent announces the largest in-kind software donation ever in its longstanding relationship with the Georgia Institute of Technology.
Dossier de presse 2013-02-04 |
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Agilent Technologies Expands Infiniium 9000 Series Lineup with 600-MHz Oscilloscopes
First Mixed-Signal Scope Supporting MIPI and SATA Applications
Dossier de presse 2009-10-01 |
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Agilent Technologies Facilitates Industry Deployment of PCI Express 2.0 with New Compliance Test Sol
Dossier de presse 2007-11-05 |
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Agilent Technologies Improves Industry's First DisplayPort Source Compliance, Characterization Test
Dossier de presse 2007-12-05 |
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Agilent Technologies Introduces Industry's Fastest Logic Analyzer
New Instrument Offers Reliable Data Capture Rates up to 4 Gb/s on Industry's Smallest Eye Openings
Dossier de presse 2011-03-28 |
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Agilent Technologies Introduces Industry's First DisplayPort Compliance Test Solution
Dossier de presse 2007-12-05 |
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Agilent Technologies Introduces Industry's Highest-Performance USB Protocol Analyzer and Jammer
The new USB 3.0/2.0 analyzers combine the industry's deepest trace buffers - up to 18 GB - with its most powerful triggering engine.
Dossier de presse 2011-09-19 |
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Agilent Technologies Introduces Industry-First Half-Size Mid-Bus Probing Solution for PCI Express®
Dossier de presse 2009-06-04 |
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Agilent Technologies Introduces Industry-First, Most Comprehensive DDR3 Test Suite
Dossier de presse 2009-04-30 |
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Agilent Technologies Introduces Million-Bit-Per-Minute Channel Simulator for Signal Integrity
Dossier de presse 2009-02-03 |
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Agilent Technologies Launches Recognition Program for EDA Experts
Agilent launches its Agilent Certified Expert recognition program for EDA experts. Eligible participants include individuals demonstrating a high level of expertise-both theoretical and practical-in applying Agilent EEsof EDA tools for product design and modeling.
Dossier de presse 2013-03-12 |
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Agilent Technologies Releases Official SATA Revision 3.0 Test Procedures
Dossier de presse 2009-10-21 |
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Agilent Technologies Serial ATA Backgrounder - Thorough Characterization and Validation of Serial AT
Dossier de presse 2009-09-09 |
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Agilent Technologies shipping complete transceiver testing for W- USB solution
Dossier de presse 2009-11-18 |
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Agilent Technologies to Demonstrate High-Speed Digital Design Solutions at EPEPS
Agilent announces it will demonstrate its high-speed digital design solutions at EPEPS 2012, Oct. 22-23, at the Tempe Mission Palms Hotel, in Tempe, Ariz.
Dossier de presse 2012-10-22 |
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Agilent Technologies to Demonstrate Industry-First PCI Express(r) Jammer, Jitter Tolerance Test for
Dossier de presse 2009-02-02 |
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Agilent Technologies to Demonstrate Newest High-Speed Digital Design and Test Solutions at DesignCon
Agilent announces it will demonstrate its high-speed digital design and test solutions at DesignCon, Jan. 28- 31, at the Santa Clara Convention Center (Booth 201).
Dossier de presse 2013-01-15 |
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