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High-Speed Digital

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In digital standards, every generational change puts new risks in your path. We see it firsthand when creating our products and working with engineers like you. Agilent’s solution set for high-speed digital test is a combination of instrumentation and broad expertise built on our ongoing involvement with industry experts. By sharing our latest experiences, we can help anticipate challenges and accelerate your ability to create products you’ll be proud of. Agilent - achieve your best design.

Navigate the entire design cycle

Explore this web site for solutions within all four stages of the design cycle as well as the crucial—and integral—field of signal integrity analysis.

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Agilent Introduces PI Solution to Solve Key Challenge in Designing Power Distribution Networks 
A power integrity solution to quickly and accurately solve the perforated-plane power integrity challenge

Dossier de presse 2011-02-01

 
Agilent Technologies and Fujitsu Microelectronics Pacific Asia Ltd. to Deliver Chipset Test Solution 

Dossier de presse 2007-10-24

 
Agilent Technologies and SiSoft Introduce Pre-Standard IBIS-AMI Modeling Guide 
Agilent and Signal Integrity Software, Inc. (SiSoft) announce guidelines that enable system designers to use advanced jitter and broadband analog capabilities when modeling high-speed serial devices.

Dossier de presse 2013-01-29

 
Agilent Technologies Announces YouTube Channel for Agilent EEsof EDA 
Channel Features More than 100 Videos with Subtitles in 50 Languages.

Dossier de presse 2010-01-19

 
Agilent Technologies Commits $90 Million Gift of Software to Georgia Institute of Technology 
Agilent announces the largest in-kind software donation ever in its longstanding relationship with the Georgia Institute of Technology.

Dossier de presse 2013-02-04

 
Agilent Technologies Introduces Million-Bit-Per-Minute Channel Simulator for Signal Integrity 

Dossier de presse 2009-02-03

 
Agilent Technologies Launches Recognition Program for EDA Experts 
Agilent launches its Agilent Certified Expert recognition program for EDA experts. Eligible participants include individuals demonstrating a high level of expertise-both theoretical and practical-in applying Agilent EEsof EDA tools for product design and modeling.

Dossier de presse 2013-03-12

 
Agilent Technologies to Demonstrate High-Speed Digital Design Solutions at EPEPS 
Agilent announces it will demonstrate its high-speed digital design solutions at EPEPS 2012, Oct. 22-23, at the Tempe Mission Palms Hotel, in Tempe, Ariz.

Dossier de presse 2012-10-22

 
Agilent Technologies to Demonstrate Newest High-Speed Digital Design and Test Solutions at DesignCon 
Agilent announces it will demonstrate its high-speed digital design and test solutions at DesignCon, Jan. 28- 31, at the Santa Clara Convention Center (Booth 201).

Dossier de presse 2013-01-15

 
Agilent Technologies to Demonstrate Newest High-Speed Digital Design Techniques at DesignCon 2011 
Agilent Technologies announces that it will demonstrate its high-speed digital test solutions at DesignCon 2011, Jan. 31- Feb. 2, at the Santa Clara Convention Center, Booth 201

Dossier de presse 2011-01-25

 
Agilent Technologies to Showcase Latest High-Speed Digital Design Techniques at DesignCon 2010 

Dossier de presse 2010-01-19

 
Agilent Technologies' Advanced Design System 2010 to Support Emerging IBIS-AMI Modeling Standard 

Dossier de presse 2010-02-01

 
Agilent Technologies' Advanced Design System 2011 EDA Platform to Debut via YouTube and Webcast 
ADS 2011 debuts on YouTube and Webcast.

Dossier de presse 2011-02-22

 
Agilent Technologies' New Channel Simulator Mode Determines Ultralow Bit-Error-Rate in Seconds 
Announcing the new statistical mode for the ADS signal integrity Channel Simulator.

Dossier de presse 2009-10-19

 
Agilent Technologies’ Advanced Design System Selected by ADATA to Speed Product Development 
ADATA Technology Co., a provider of complete memory solutions in Taipei, Taiwan, has selected ADS software for developing memory modules for the high-speed digital market.

Dossier de presse 2012-05-15

 
Agilent to Demonstrate Industry-First Capabilities at DesignCon 2009 
Agilent Technologies to Demonstrate Industry-First PCI Express(r) Jammer, Jitter Tolerance Test for Clock Devices, Million-Bit-Per-Minute Channel Simulator at DesignCon 2009

Dossier de presse 2009-02-02

 
Agilent to Demonstrate Newest High-Speed Digital Design and Test Solutions at DesignCon 2012 
Agilent's high-speed digital solutions offer a wide range of essential tools to help engineers design and simulate, analyze, debug and achieve compliant designs while cutting through the challenges of gigabit digital designs.

Dossier de presse 2012-01-23

 
Agilent to Demonstrate Test Solutions at International Symposium on Electromagnetic Compatibility 
Agilent will demonstrate its test solutions at the IEEE International Symposium on Electromagnetic Compatibility in Pittsburg, Aug. 5-10, 2012.

Dossier de presse 2012-07-18

 
ClioSoft Announces the Integration of SOS Design Data Management with Advanced Design System 
ClioSoft's integrated solution offers ADS users seamlessly integrated revision control and enterprise design data management

Dossier de presse 2013-05-07

 
Collaboration with CMC Microsystems Provides EDA Tools to Universities and Colleges Across Canada 

Dossier de presse 2010-02-03

 
Electrical Redriver Modeling Solution to Solve Key Challenges in Designing Chip-to-Chip Links 
Agilent introduces a redriver modeling solution designed to quickly and accurately solve the challenge posed by signal distortion in multigigabit-per-second systems.

Dossier de presse 2012-11-05

 
Press Releases for N5990A 
Press Releases for N5990A

Dossier de presse 2013-05-06

 
STATS ChipPAC Launches QFN Package Design Kit for Agilent Technologies’ Advanced Design System 
STATS ChipPAC announces the launch of its Quad Flat No-Lead (QFN) package design kit for ADS.

Dossier de presse 2012-09-12

 
Stereo Viewer with NVIDIA 3D Vision Technology Brings James Clerk Maxwell’s Famous Equations to Life 

Dossier de presse 2009-12-14