Long Term Evolution - LTE Test
Greater insight. Greater confidence. Accelerate next-generation wireless.
Agilent gives you “greater insight” into your Long Term Evolution (LTE) designs and LTE Test. We provide reduced design uncertainty, faster and easier development of high-performing LTE products and help you find root causes faster. Now with first-to-market test solutions for LTE-Advanced.
To learn more about LTE technology : LTE Technology Overview
To learn more about the LTE implementation of MIMO: MIMO Test
Receive App Notes, CD's and other resources : Long Term Evolution - LTE Resources
To find the product that fits your stage of Long Term Evolution (LTE) development see links to the left.
What's New
- Order the new LTE and LTE-Advanced & WLAN Design & Test 2013 DVD
- Announcing Second Edition LTE and LTE-Advanced Book
- Download New App Note: Solutions and Measurement Tools for Use in Power and Envelope Tracking Design
- Learn about new LTE-Advanced 8x8 MIMO Signal-Generation and Analysis solutions
- New HSPA+ app note available - Concepts and Measurements of HSPA+ Evolution
Refine the List
remove all refinementsBy Application
- RF & Baseband R&D LTE Design and Test Equipment (29)
- Verification, Integration, Protocol and Conformance of LTE Equipment (18)
- LTE Manufacturing Test Equipment (2)
- Installation & Maintenance of LTE Equipment (5)
- TD-LTE Design and Test Equipment (6)
By Type of Content
- Document Library
- Press Releases
- Press Materials (54)
- Press Releases
By Product Category
26-50 of 54
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Agilent Technologies Launches Measurement Applications, Expands LTE Leadership
Agilent Technologies Inc. (NYSE: A) today introduced eight new measurement applications for its PXA X-Series signal analyzer.
Press Materials 2010-09-01 |
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Agilent Technologies Named Oscilloscope Company of the Year
The award is based on Frost & Sullivan's recent analysis of the oscilloscope market. Frost & Sullivan ranked Agilent as the No. 2 company in 2009, but its rapid revenue growth since then has made it the leader in market penetration.
Press Materials 2012-04-25 |
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Agilent Technologies Now Offers Most Comprehensive Real-Time Diagnostics, Analysis for LTE
Press Materials 2009-02-16 |
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Agilent Technologies Partners with Innowireless on LTE Test Solutions
Agilent Technologies Inc. (NYSE: A) today announced it has formed a strategic partnership with Innowireless Co., Ltd. to enhance the rapid development of LTE wireless test platforms.
Press Materials 2010-05-05 |
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Agilent Technologies Publishes Comprehensive Book on LTE Measurement, Design Challenges
Press Materials 2009-02-16 |
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Agilent Technologies Recognized for Leadership in LTE and WiMAX™ Test Equipment Market
Press Materials 2009-12-15 |
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Agilent Technologies to Collaborate with Southeast University--China to Research 3GPP-LTE Systems Pe
Press Materials 2009-07-14 |
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Agilent Technologies to Demonstrate Bench-Top LTE RF Mobile Device Characterization on E6620 Platfor
Press Materials 2009-02-16 |
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Agilent Technologies to Demonstrate LTE Test Solutions for Entire Development Lifecycle at LTE World
Press Materials 2008-11-17 |
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Agilent Technologies to Display Newest Mobile Communications Test, Measurement Solutions at 2009 Mob
Press Materials 2009-02-02 |
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Agilent Technologies to Introduce First-to-Market 3GPP LTE Test Solutions
Press Materials 2008-01-09 |
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Agilent Technologies to Show Latest LTE Test Solutions at LTE Americas 2009
Press Materials 2009-11-02 |
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Agilent Technologies to Showcase 3GPP LTE Test Solutions at 2007 European Microwave Conference
Press Materials 2007-10-01 |
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Agilent Technologies to Showcase LTE Test Solutions at LTE World Summit 2010
Agilent Technologies to Showcase LTE Test Solutions at LTE World Summit 2010
Press Materials 2010-05-04 |
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Agilent Technologies Updates Advanced Design System EDA Software to Enhance Serial Link Design
Press Materials 2007-09-27 |
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Agilent Technologies Wins Informa LTE North America Award
Moray Rumney, the lead technologist specializing in LTE at Agilent, has won the Informa LTE North America 2010 award for individual contribution to LTE development.
Press Materials 2010-11-17 |
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Agilent Technologies' LTE Test Solutions Now Compliant with March 2008 LTE Standard
Press Materials 2008-06-21 |
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Agilent Technologies' New Drive Test Measurements Speed Deployment, Cut Costs of LTE Networks
Press Materials 2009-02-02 |
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Agilent Technologies' New LTE Base-Station Emulator Speeds Development and Verification of LTE User
Agilent Technologies Inc. (NYSE: A) today announced the PXT Wireless Communications Test Set, a powerful, common hardware test platform for use across the LTE development lifecycle.
Press Materials 2010-09-01 |
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Agilent Technologies' PXT Wireless Communications Test Set Now Supports Critical LTE Inter-RAT Hand
Agilent Technologies Inc. (NYSE: A) today announced new functional test features for its E6621A PXT wireless communications test set.
Press Materials 2011-02-09 |
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Agilent Technologies, Altair Semiconductor Team Up to Accelerate LTE Device and Test Equipment Matur
Agilent Technologies Inc. (NYSE: A) and Altair Semiconductor today announced they will jointly conduct interoperability testing and validation testing using Altair's 4G LTE chipset in conjunction with the Agilent PXT wireless communications test set and N6070A-series signaling conformance test software. The joint effort will accelerate the development of LTE devices and testing solutions into new operating bands.
Press Materials 2011-02-11 |
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Agilent Technologies, ASTRI, PicoChip Demonstrate Design and Test of TD-LTE Femtocell at 2009 Mobile
Press Materials 2009-02-16 |
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Agilent Technologies’ New LTE Applications Target 4G System-Level Designers
Press Materials 2010-02-16 |
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Agilent Technologies’ Test Solutions Support March 2009 LTE Standard
Press Materials 2009-08-04 |
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Agilent | Agilent Technologies and Innofidei Announce Joint Development of RF Tests for TD-LTE Chips
The test development is based on the 3GPP LTE specifications, Innofidei’s TD-LTE test requirements, included Agilent’s N5182A signal generator and N9020A signal analyzer and followed the 3GPP LTE standard chapter 6 and 7 TX / RX characteristics.
Press Materials 2010-09-15 |
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