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Long Term Evolution - LTE Test
Greater insight. Greater confidence. Accelerate next-generation wireless.
Agilent gives you “greater insight” into your Long Term Evolution (LTE) designs and LTE Test. We provide reduced design uncertainty, faster and easier development of high-performing LTE products and help you find root causes faster. Now with first-to-market test solutions for LTE-Advanced.
To learn more about LTE technology : LTE Technology Overview
To learn more about the LTE implementation of MIMO: MIMO Test
Receive App Notes, CD's and other resources : Long Term Evolution - LTE Resources
To find the product that fits your stage of Long Term Evolution (LTE) development see links to the left.
What's New
- Order the new LTE and LTE-Advanced & WLAN Design & Test 2013 DVD
- Announcing Second Edition LTE and LTE-Advanced Book
- New HSPA+ app note available - Concepts and Measurements of HSPA+ Evolution
- Learn about new LTE-Advanced 8x8 MIMO Signal-Generation and Analysis solutions
- Download New App Note: Solutions and Measurement Tools for Use in Power and Envelope Tracking Design
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- TD-LTE Design and Test Equipment
By Type of Content
- Document Library
- Press Releases
- Press Materials (6)
- Press Releases
1-6 of 6
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Agilent Technologies and CATR (TMC) to Collaborate on TD-LTE MIMO
Agilent Technologies Inc. (NYSE: A) announced a memorandum of understanding has been signed with the China Academy of Telecommunication Research (Telecommunication Metrology Center), or CATR (TMC). The two organizations have agreed to work together on TD-LTE MIMO over-the-air (OTA) test research.
Press Materials 2012-09-13 |
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Agilent Technologies Delivers Wide Range of Commercial Test Products for TD-LTE
Press Materials 2009-02-16 |
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Agilent Technologies to Show Latest LTE Test Solutions at LTE Americas 2009
Press Materials 2009-11-02 |
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Agilent Technologies, ASTRI, PicoChip Demonstrate Design and Test of TD-LTE Femtocell at 2009 Mobile
Press Materials 2009-02-16 |
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Agilent Technologies’ Test Solutions Support March 2009 LTE Standard
Press Materials 2009-08-04 |
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Agilent | Agilent Technologies and Innofidei Announce Joint Development of RF Tests for TD-LTE Chips
The test development is based on the 3GPP LTE specifications, Innofidei’s TD-LTE test requirements, included Agilent’s N5182A signal generator and N9020A signal analyzer and followed the 3GPP LTE standard chapter 6 and 7 TX / RX characteristics.
Press Materials 2010-09-15 |
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