Long Term Evolution - LTE Test
Greater insight. Greater confidence. Accelerate next-generation wireless.
Agilent gives you “greater insight” into your Long Term Evolution (LTE) designs and LTE Test. We provide reduced design uncertainty, faster and easier development of high-performing LTE products and help you find root causes faster. Now with first-to-market test solutions for LTE-Advanced.
To learn more about LTE technology : LTE Technology Overview
To learn more about the LTE implementation of MIMO: MIMO Test
Receive App Notes, CD's and other resources : Long Term Evolution - LTE Resources
To find the product that fits your stage of Long Term Evolution (LTE) development see links to the left.
What's New
- Order the new LTE and LTE-Advanced & WLAN Design & Test 2013 DVD
- Announcing Second Edition LTE and LTE-Advanced Book
- New HSPA+ app note available - Concepts and Measurements of HSPA+ Evolution
- Learn about new LTE-Advanced 8x8 MIMO Signal-Generation and Analysis solutions
- Download New App Note: Solutions and Measurement Tools for Use in Power and Envelope Tracking Design
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By Type of Content
- Document Library
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- Press Materials (2)
- Press Releases
1-2 of 2
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Agilent Technologies Announces Test Software for Equipment Based on Altair TDD/FDD LTE Chipset
Press Materials 2012-02-28 |
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Agilent Technologies Announces Wireless Communications Test Set with Innovative Multiport Adapter
Agilent Technologies introduced the E6607B EXT wireless communications test set and companion E6617A multiport adapter. Optimized for non-signaling testing, the EXT/MPA combination increases test throughput and reduces the cost of test in the manufacturing of current- and next-generation smartphones and tablets that contain multiformat and multiband technologies.
Press Materials 2012-08-01 |
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