USB (2.0/3.0/Wireless) Design & Test Information Resource Center
USB 2.0 provides the 480 Mb/s data rate to accommodate data transfers between peripherals and computers. USB 2.0 devices are backwards compatible with USB 1.1 devices. USB 2.0 is also known as Hi-Speed USB.
USB 3.0 is a dual-bus architecture that incorporates USB 2.0 and a SuperSpeed bus (nominal data rate is 5 Gb/s).
Wireless USB is the wireless extension to USB that combines the speed and security of wired technology with the ease-of-use of wireless technology. Wireless USB supports robust high-speed wireless connectivity by utilizing the common WiMedia MB-OFDM Ultra-wideband (UWB) radio platform as developed by the WiMedia Alliance.
Specifications and compliance tests are defined by the USB Implementers Forum. The resources you find here will provide you with an overview of USB design, understand the latest measurement techniques, and illustrate design and debug approaches. Agilent – achieve your best design.
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J-BERT N4903B High-Performance Serial BERT - Data Sheet Version 1.3
This data sheet documents the capabilities of the N4906B, Agilent's high-performance serial BERT for R&D characterization compliance testing and for manufacturing volume ramp testing.
Hoja de datos 2013-04-10 |
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1.90 MB
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N5416A and N5417A USB Compliance Test Software for Infiniium Oscilloscopes - Data Sheet
N5416A provides a fast and reliable way to verify USB electrical specification compliance for USB 2.0 devices, hosts, and hubs.
Hoja de datos 2013-04-30 |
PDF
1.09 MB
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U4611A/B USB 2.0/3.0 Protocol Analyzer - Data Sheet
The U4611A/B USB 2.0/3.0 Protocol Analyzer helps designers of USB devices test and isolate problems in their devices and system designs.
Hoja de datos 2011-12-21 |
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U7243A USB 3.0 Superspeed Electrical Performance Validation
The USB 3.0 electrical test software allows you to automatically execute USB 3.0 electrical tests, and it displays the results in a flexible report format. In addition to the measurement data, the report provides a margin analysis that shows how closely your device passed or failed each test
Hoja de datos 2011-12-13 |
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